Method and device for measuring particulate matters by using dual wavelength polarized light scattering
A technology for scattering measurement and particle matter, which is applied in the direction of measuring devices, particle and sedimentation analysis, particle size analysis, etc., can solve the problems of unimproved measurement accuracy, detector error, single index, etc., to avoid low index resolution, Effect of cost control and quantity reduction
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[0028] The present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings, which are divided into two parts: measuring method and device, but the following description is only exemplary and should not limit the protection scope of the present invention.
[0029]The measurement method in the present invention is a particle measurement method based on the scattering characteristics of dual-wavelength polarized light. The sample to be measured flows through the test area of the scattering chamber at a constant flow rate, and the test area is irradiated with dual-wavelength polarized light to measure the emitted particle at a specific scattering angle. The polarization characteristics of scattered light, so that the properties of particle morphology and composition that cannot be measured by traditional light scattering methods can be obtained. According to the theory, the particle size is mainl...
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