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Method and device for measuring particulate matters by using dual wavelength polarized light scattering

A technology for scattering measurement and particle matter, which is applied in the direction of measuring devices, particle and sedimentation analysis, particle size analysis, etc., can solve the problems of unimproved measurement accuracy, detector error, single index, etc., to avoid low index resolution, Effect of cost control and quantity reduction

Inactive Publication Date: 2018-11-20
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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Problems solved by technology

At present, the particle measuring instrument based on the principle of light scattering is mainly used in the detection of particle size and mass concentration, and its measurement accuracy has not been improved due to the single index and detector error.
In terms of particle morphology and composition measurement, there are currently no relatively mature products at home and abroad, and relatively few related researches have been carried out.

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  • Method and device for measuring particulate matters by using dual wavelength polarized light scattering
  • Method and device for measuring particulate matters by using dual wavelength polarized light scattering
  • Method and device for measuring particulate matters by using dual wavelength polarized light scattering

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Embodiment Construction

[0028] The present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings, which are divided into two parts: measuring method and device, but the following description is only exemplary and should not limit the protection scope of the present invention.

[0029]The measurement method in the present invention is a particle measurement method based on the scattering characteristics of dual-wavelength polarized light. The sample to be measured flows through the test area of ​​the scattering chamber at a constant flow rate, and the test area is irradiated with dual-wavelength polarized light to measure the emitted particle at a specific scattering angle. The polarization characteristics of scattered light, so that the properties of particle morphology and composition that cannot be measured by traditional light scattering methods can be obtained. According to the theory, the particle size is mainl...

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Abstract

The invention discloses a method and device for measuring particulate matters by using dual wavelength polarized light scattering. The method includes the following steps: 1) letting a to-be-measuredparticulate matter sample flow through a scattering cavity test area with a constant speed, and irradiating the test area after a laser is processed through polarization; 2) making an incident laser polarization state horizontally polarized, measuring the Stokes vector (S0, S1, S2, S3)<T> of scattered light at a specific angle after incident light is scattered by current particulate matters, calculating Hdop as a main index reflecting particulate matter morphology, calculating Pdop as a main index reflecting particulate matter absorption, and calculating Rdop as a main index reflecting particulate matter components; 3) making the incident laser polarization state being 45 DEG linear polarization, the rest operation being the same with the step 2); 4) making the incident laser polarizationstate being right-hand circular polarization, the rest operation being the same with the step 2); and 5) analyzing the integration attribute of the current particulate matters through an obtained index set. The method can realize on-line rapid comprehensive analysis on the integration attribute of particulate matters. In addition, the device can maximumly reduce the number of detectors.

Description

【Technical field】 [0001] The invention relates to real-time on-line detection of particulate matter in the air, in particular to a method and device for measuring particulate matter by dual-wavelength polarized light scattering. 【Background technique】 [0002] The impact of atmospheric particulate matter on the environment is becoming more and more serious, and its composition is complex and its sources are diverse. Researchers need to discriminate and analyze the sources of particulate matter based on their physical and chemical characteristics. The shape and complex refractive index can describe the physical characteristics of the shape and composition of atmospheric particles, and the imaginary part of the complex refractive index can reflect the light absorption properties of the substance. Different types of particulate matter usually have different shapes. Simpler shapes include balls (water, coal-burning particles, etc.) and columns (fibers), and more complex shapes, ...

Claims

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Application Information

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IPC IPC(8): G01N15/02G01N15/00
CPCG01N15/00G01N15/0205
Inventor 曾楠展东剑何永红马辉
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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