JTAG link based circuit board test system and method

A test system and circuit board technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of BGA packaged chips having no testing ability, low test coverage, and relying on testers, etc., to achieve improved test coverage, The effect of reducing equipment cost and improving test stability

Active Publication Date: 2018-12-11
CHINA ACADEMY OF RAILWAY SCI CORP LTD +2
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AI Technical Summary

Problems solved by technology

Automatic testing solves the contradiction of manual testing to a certain extent, but there are still contradictions between platform cost and test stability, test speed and test stability
[0005] At the same time, the above two methods have no test capability for densely packaged large-scale integrated circuits and BGA packaged chips with invisible pins. For large-scale integrated chip products, the test coverage is very low
Aiming at the problem of low efficiency and over-reliance on testers in the circuit board testing method in the related art, no effective solution has been proposed so far

Method used

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  • JTAG link based circuit board test system and method
  • JTAG link based circuit board test system and method
  • JTAG link based circuit board test system and method

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Embodiment Construction

[0043] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0044] The embodiment of the present invention provides a circuit board testing system based on JTAG link, figure 1It is a structural schematic diagram of a circuit board testing system provided by an embodiment of the present invention. Such as figure 1 As shown in the middle part of the solid line, the system mainly includes: main controller 11, general equipment 12, JTAG (Joint Test Action Group, joint test working group) link controller 13, JT...

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Abstract

The invention discloses a JTAG link based circuit board test system and method. The system comprises a master controller, general instrument equipment, a JTAG link controller, a first JTAG link chip and a JTAG accompanied test tool; the master controller sends a test instruction to the general instrument equipment and the JTAG link controller, and the general instrument equipment and the JTAG linkcontroller generate an excitation signal according to the test instrument and send the excitation signal to a tested circuit board; the JTAG link controller can send the excitation signal to the tested circuit board via the first JTAG link chip directly so as to excite the circuit board to generate a response signal; or, the excitation signal is sent to the tested circuit board via the JTAG accompanied test tool indirectly, and the circuit board is excited to generate the response signal; the JTAG link controller compares the digital excitation signal with the digital response signal and sends a comparison result to the master controller; the general instrument equipment sends an analog response signal generated by the tested circuit board to the master controller; and the mater controller determine whether the tested circuit board is normal according to the comparison result, the test instruction and the analog response signal.

Description

technical field [0001] The invention relates to the technical field of equipment detection, in particular to a circuit board testing system and testing method based on a JTAG link. Background technique [0002] At present, the following two methods are generally used for testing circuit boards and system products: [0003] 1) Manually screen and detect through instruments (such as signal sources, high-precision multimeters, etc.). This test method does not fully test the qualification and functional integrity of the board, and is too dependent on the operator's knowledge level, operating proficiency, and factors such as the full contact between the tested point of the board to be tested and the test pen. The degree of fatigue of personnel can directly affect the correctness and adequacy of test results. That is, this testing method relies too much on human factors, resulting in low production efficiency and manual repeated testing. [0004] 2) The traditional automatic te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/3185
CPCG01R31/318533G01R31/318597
Inventor 杨光威王霖李水昌马颖涛徐晗陶元之赵雷廷
Owner CHINA ACADEMY OF RAILWAY SCI CORP LTD
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