System and method for measuring dynamic resistance of conductive fabric

Abstract

The invention relates to a measurement system and method for dynamic resistance of conductive fabric and belongs to the field of tests of conductive materials. The system comprises a corresponding resistor, a pair of test heads, a data acquisition treatment system and a PC terminal, wherein the conductive fabric and the corresponding resistor are connected in series to form a closed circuit; one end of the pair of the test heads is connected with two ends of the conductive fabric, the other end is connected with an input end of the data acquisition treatment system, an output end of the data acquisition treatment system is connected with the PC terminal, and the PC terminal can display real-time resistance. The measurement method is used for measuring dynamic resistance which is produced by the conductive fabric with high resistivity in the stress deformation process and varies with time variation, the tested resistance range is 1-2,000 omega, the resistance variation interval can be accurate to 0.01 omega, and the acquisition frequency is set as 10-30 times per sec. By means of the measurement system and method, precise real-time monitoring can be realized, and meanwhile, the problems of smaller resistance variation of the conductive fabric, low system acquisition frequency and missing of variation details are solved.

Description

technical field [0001] The invention belongs to the field of conductive material testing, and relates to a system for measuring the dynamic resistance of conductive fabrics, which is aimed at measuring the dynamic resistance that changes with time during the force deformation process of conductive fabrics with high resistivity. [0002] technical background [0003] In recent years, conductive materials have emerged continuously, and smart devices based on conductive materials have shown explosive growth in the market. Due to the characteristics of flexibility, easy cleaning and high comfort of conductive materials or fabrics, they can completely replace hardware components and be applied to various In such products, conductive materials and fabrics are favored by researchers. [0004] In the process of testing conductive materials, the following three problems are often encountered: [0005] 1. The resistance is too large or the change range is too small. At present, most ...

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Problems solved by technology

[0005] 1. The problem of too large resistance or too small change range

At present, most of the ordinary electronic multimeters on the market are mainly used to measure static values. When the change of conductive material is too small, the material is affected by the environment or other interference factors, and the value of the electronic multimeter does not change significantly.

[0006] 2. It is impossible to display the characteristics of real-time measurement over time

Especially for materials with too large resistance and small changes, ordinary electronic multimeters display by collecting one data per second, which cannot accurately and continuously show the trend of resistance changes over time

[0007] 3. The collection frequency is low, and the problem of missing details changes

Ordinary electronic multimeters have a low collection frequency and cannot continuously collect data per second, and are affected by interference factors such as the environment, and the collected data may be missed

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