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Contact head for electrical testing device, and testing device

A technology of electrical detection and contact head, which is applied in the field of contact head to achieve the effect of reducing tolerance requirements

Active Publication Date: 2018-12-14
FEINMETALL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Since different space temperatures and / or test temperatures may exist when performing the test, it is necessary that thermally induced changes in the length of the test device do not lead to a deviation in the positioning of the contact elements with respect to the electrical contacts on the test piece or on the substrate As a result, the detection can no longer be successfully performed

Method used

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  • Contact head for electrical testing device, and testing device
  • Contact head for electrical testing device, and testing device
  • Contact head for electrical testing device, and testing device

Examples

Experimental program
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Embodiment Construction

[0026] figure 1A schematic illustration shows a section through an electrical testing device 1 which is designed for electrical contacting of a substrate 2 having a plurality of electrical contact points. The substrate 2 is designed, for example, as a wafer 3 , a circuit board or a solar cell and can be placed, in particular, on a carrier 4 of the testing device 1 . The carrier 4 , also referred to as a chuck, is designed such that it can be cooled or heated, wherein cooling and / or heating devices are preferably integrated into the carrier 4 or arranged thereon for this purpose. This makes it possible for the substrate 2 to be subjected to different temperatures during the execution of the test, so that the functionality of the substrate 2 can be determined even at different temperatures. For contacting the substrate 2 , the test device 1 has a so-called test card 5 , which has a contact head 6 and a coupling device 7 for carrying out the test. The contact head 6 carries a p...

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PUM

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Abstract

A contact head for an electrical test device for electrically testing substrates. The substrates have electrical contact points, with at least two guide plates that are arranged to each other by a spacer and each have guide openings essentially aligned with each other for receiving pin-shaped contact elements and are oriented to each other by a centering device. The centering device has four centering pins, which are displaceably mounted in a slot, extending toward a center of the contact head, at least of one of the guide plates. The centering pins are each held in a centering opening of thespacer. It is provided that the centering openings each have only one guide surface oriented at least essentially parallel to a radial axis in relation to the center.

Description

technical field [0001] The invention relates to a contact head for an electrical testing device for electrical testing of a substrate having electrical contact points, in particular electrical conductors and / or electrical / electronic components, said The contact head has at least two guide plates which are arranged parallel to one another via a spacer and each have a plurality of guide openings at least substantially aligned with one another for accommodating pin-shaped contact elements, The centering devices are aligned relative to each other, wherein the centering devices have four centering pins, which can be respectively positioned in elongated holes in at least one of the guide plates extending towards the center of the contact head. displaceable, and wherein the centering pins are each held in a centering opening of the spacer. [0002] Furthermore, the invention relates to an electrical testing device for electrical testing of a substrate having electrical conductors an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R31/00
CPCG01R1/0416G01R31/00G01R1/44G01R31/2831G01R31/2886G01R1/06738
Inventor 斯蒂芬·特罗茨D·达巴考B·科皮拉斯
Owner FEINMETALL