New wheat variety dry-hot wind resistance identifying method and specialized temperature control shed
An identification method and variety technology, applied in botanical equipment and methods, greenhouse cultivation, climate change adaptation, etc., can solve the difficulty of determining key indicators, failure to comprehensively express the relative and absolute yield levels of wheat varieties, and the needs of quality inspection indicators for flour Large volume and other issues
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0064] The identification method of the new wheat variety resistant to dry and hot wind and the structure and use principle of the special temperature-controlled shed of the present invention will be further described in detail below in conjunction with the specific embodiments of the accompanying drawings.
[0065] The invention provides a new wheat variety resistance to dry and hot wind identification method, the method includes yield and dry hot wind resistance identification method, quality dry and hot wind identification method and comprehensive performance comparison;
[0066] The method for identifying yield resistance to hot and dry wind comprises the following steps:
[0067] The first step is to organize the land
[0068] Arrange plots in two identical test areas according to the number of wheat varieties to be identified, and the number of plots in each test area ≧ (number of wheat varieties to be identified + 1) × 2;
[0069] The second step is to select yield con...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com