Chip strip counting device and method based on photoelectric detection

A technology of photoelectric detection and counting devices, applied in the direction of counting mechanisms/items, instruments, etc., can solve the problems of large-scale equipment cost and portability, and achieve the effects of solving cost and portability, easy operation, solving efficiency and accuracy
CN109034345BActive Publication Date: 2019-04-09SHANDONG HUAYI MICRO ELECTRONICS

Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Patents(China)
Current Assignee / Owner
SHANDONG HUAYI MICRO ELECTRONICS
Publication Date
2019-04-09

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Abstract

The invention discloses a chip strip counting device and method based on photoelectric detection. A damaged mark hole is punched on the fixed corner of the damaged chip, and a central positioning hole is opened at the front end of each row of chips in the center of the chip strip. Open multiple side positioning holes on both sides of the chip strip, use photoelectric detection technology to detect whether the chip in the strip is a punched chip, and count the number of chips contained in the detected strip and the punched chip through the control unit quantity.
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Description

technical field

[0001] The invention relates to a chip strip counting device and method, in particular to a chip strip counting device and method based on photoelectric detection. Background technique

[0002] Chip strips can be divided into contact strips and non-contact strips according to the chips they carry. The way to identify whether a strip chip is damaged is as follows: when the chip leaves the factory, a circular hole will be punched on the fixed corner of the damaged chip to This is an external manifestation of damaged chips.

[0003] In terms of strip detection and counting, the existing methods are manual detection and counting and some large-scale equipment with counting functions when performing quality detection on the strips; manual detection takes a long time, the detection efficiency is low, and it is easy to cause holes due to long-term observation. Fatigue causes false detection; large-scale equipment detection is not cost-effective, cumbersome to opera...

Claims

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