Demonstrating device specialized for single-seam diffraction experiment

Abstract

The invention relates to the field of teaching appliances, and particularly to a demonstrating device specialized for a single-seam diffraction experiment. The demonstrating device comprises an iron plate on which a variable-angle adjusting mechanism is fixed. Two sides of the variable-angle adjusting mechanism are respectively provided with a laser emitter and a projection board. The variable-angle adjusting mechanism comprises an annular rack and an annular plate. The external circular edge of the annular rack is provided with a plurality of sets of adjusting assemblies. An end, which is aligned to the circle center of the annular rack, of the adjusting assembly is connected with two connecting rods with the same structure. Furthermore the ends, which are aligned to the circle center ofthe annular rack, of two adjacent connecting rods on the two adjacent adjusting assemblies are hinged through a pin. The external circular edge of the annular plate is provided with arc-shaped troughswhich correspond with the adjusting assemblies. The demonstrating device for the single-beam diffraction experiment can realize continuous acquisition of laser projection diffraction images on the condition of continuous seam width change, and can acquire the corresponding diffraction image in one time. The demonstrating device has advantages of simple operation, low labor amount, high vividness,high interest, effective interest improvement of students, and high suitability for popularization in teaching.

Description

Technical field [0001] The invention relates to the field of teaching appliances, in particular to a demonstration device dedicated to single-slit diffraction experiments. Background technique [0002] The single-slit diffraction experiment is one of the important contents of university basic teaching. It is widely used and has very important application value. At present, in order to facilitate students’ understanding of single-slit diffraction, the laboratory is equipped with corresponding experimental equipment, but the current experimental equipment is unable to continuously change the slit width and the corresponding image collection of the projection form, that is, the current experimental equipment operation method is Adjusting the slit width intermittently and collecting patterns separately for collection and comparison analysis, on the one hand, is more complicated and labor intensive, on the other hand, boring and uninteresting is not conducive to raising students' inte...

AI Technical Summary

Problems solved by technology

At present, in order to facilitate students' understanding of single-slit diffraction, the laboratory is equipped with corresponding experimental equipment, but the current experimental equipment cannot perform continuous slit width changes and corresponding image collection of projection shapes, that is, the current experimental equipment operation mode is Intermittently adjusting the slit width and collecting patterns separately for collection and comparison analysis, on the one hand, it is more complicated and labor-intensive, on the other hand, it is boring and not conducive to improving students' interest. In view of this, we propose a demonstration device dedicated to single-slit diffraction experiments

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