Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Panel driving system and source driver

A technology of source driver and panel drive, applied in the direction of instruments, static indicators, etc., can solve problems such as failure of pixel sensing devices, and achieve the effect of preventing failure

Active Publication Date: 2018-12-21
SILICON WORKS CO LTD
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the frequency of the sampling clock exceeds the operating range of an analog-to-digital converter (ADC: Analog-Digital Converter) included in the pixel sensing device, the pixel sensing device may malfunction

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Panel driving system and source driver
  • Panel driving system and source driver
  • Panel driving system and source driver

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] Hereinafter, some embodiments of the present disclosure will be described in detail with reference to illustrative drawings. It should be noted that, in terms of adding reference numerals to constituent elements in the drawings, similar constituent elements are denoted by similar reference numerals whenever, even when shown in different drawings. In the following description of the present disclosure, when it is determined that a detailed description of a related known configuration or function makes the present disclosure unclear, the detailed description will thus be omitted.

[0033] In describing the constituent elements of the present disclosure, terms such as first, second, A, B, (a), and (b) may be used. These terms are used only to distinguish one constituent element from another constituent element, and are not intended to limit the nature, sequence or order of the constituent elements. It should be understood that when a constituent element is described as be...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a technique capable of adjusting a frequency of a sampling clock for pixel sensing according to configuration information.

Description

technical field [0001] The present disclosure relates to a technique for sensing characteristics of pixels disposed on a display panel and a technique for driving the display panel. Background technique [0002] The display device includes a panel driving device, such as a driving device including a source driver and a timing controller, that controls the brightness of pixels disposed on the panel. [0003] The panel driving device determines data voltages according to image data and supplies the data voltages to pixels, thereby controlling brightness of each pixel. [0004] Even when receiving the same data voltage, the luminance of a pixel may vary according to the characteristics of the pixel. For example, a pixel includes a driving transistor, and when the threshold voltage of the driving transistor is changed, even if the same data voltage is supplied, the brightness of the corresponding pixel can be changed. If the panel driving device does not consider such characte...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/3275
CPCG09G3/3275G09G3/3291G09G2310/08G09G2330/06
Inventor 李相珉郑敏永金元崔正熙
Owner SILICON WORKS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products