Performance evaluation method and device for electronic products based on hardware white box test

Abstract

The invention discloses an electronic product performance evaluation method and a device based on hardware white box test. The method comprises the following steps: S1. Acquiring a plurality of product samples of a target product in different running stages as test samples; S2, respectively executing hardware white box test on each test sample according to a predetermined test item, and obtaininga plurality of test waveforms and performance parameter data; S3, evaluating the running state of the target product according to the obtained test waveforms, identifying all degradation parameters from the obtained performance parameter data, and evaluating the life of the target product according to the identified degradation parameters; The device comprises a test sample acquisition module, a hardware white box test module and a product performance evaluation module. The invention can comprehensively evaluate the performance of the product, and has the advantages of simple realization method and high evaluation accuracy.

Description

technical field [0001] The invention relates to the technical field of performance evaluation of electronic products, in particular to a performance evaluation method and device for electronic products based on hardware white-box testing. Background technique [0002] The performance evaluation of the product is to analyze the operating performance status of the product and conduct life evaluation, etc. Through the performance evaluation of the product, it is possible to find out whether the product has potential operating defects in time, so as to provide guidance for product maintenance and management. The on-site operation status of the product usually shows two states of normal and fault, and the user cannot evaluate the performance status of the product on site, such as whether it is degraded or not, and the service life of the product, etc. For the performance evaluation of products, different evaluation methods are usually used for different product types. For example...

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Problems solved by technology

[0005] (1) Obtaining degradation data directly through operating data for evaluation, the obtained data is single and has little information content, and the test data of the product cannot be fully utilized, and the degradation of the product cannot be fully and comprehensively characterized, making the final evaluation accuracy not high;

[0006] (2) Since the degradation data of mechanical products are relatively easy to obtain, most of the above degradation-based performance evaluation methods are only applicable to the performance evaluation of mechanical products, and it is difficult to obtain degradation data during operation to identify degradation such as electronics products, it is not applicable

[0007] For electronic products, at present, qualitative trend analysis or failure data analysis is usually used for performance evaluation. The qualitative trend analysis method is based on qualitative models and qualitative reasoning to determine the degradation parameters, but this type of method is completely dependent on experience. Due to incomplete experimental knowledge, it is easy to miss some key degradation characteristics, so it is impossible to analyze the degradation of the product completely and comprehensively, so that the final evaluation accuracy is not high; failure data analysis is based on binary failure data of normal or fault state. , but in practice, binary failure data is difficult to obtain in a short period of time, so evaluation and analysis based on binary failure data cannot be realized

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