8 results about "White-box testing" patented technology

The invention discloses an AI-driven full-scene intelligent test platform which comprises the following steps: performing static scanning on a target code under the triggering of a code submission event through a code static scanning module to generate a scanning result, and then inputting the scanning result into a pre-trained first AI model to obtain code quality evaluation data. And generating a white box test case through a white box case generation module. In addition, a black box test case is generated through a black box case generation module. An automatic script generation module inputs the black box test case into a pre-trained fourth AI model to generate an automatic test script; and finally, running the white box test case and the automatic test script to obtain an original test report. And inputting the original test report into a pre-trained fifth AI model through a result analysis module, and generating defect distribution data and test suggestion data. The full-scene test coverage of the software life cycle is realized, the test of each link of the software is comprehensively and systematically covered, and the test efficiency is improved.

Training and / or utilization of machine learning model(s) (e.g., neural network model(s)) in automatically generating test case(s) for source code. Techniques disclosed herein can be utilized in generating test case(s) for unit test testing (or other white-box testing) and / or for functional testing (or other black-box testing).

An apparatus having fault diagnosis and localization functions and a design method therefor, and a computer-readable storage medium and an electronic device. The design method comprises: determining functions that an apparatus is required to implement, and designing functional modules; determining fault diagnosis and localization schemes for the functional modules of the apparatus and selected components, and designing fault diagnosis and localization mechanisms; designing a safety assurance module; packaging the apparatus into a finished product; and performing white-box testing, functional testing, acceleration testing and type testing on the finished apparatus product; and when the finished apparatus product fails to pass all tests, separately feeding back test results of the tests, and performing optimization and the next round of iteration until the finished apparatus product passes all the tests. By means of introducing PFMEA into a production process, conventional fault diagnosis methods simply based on DFMEA at a design stage are overcome, thereby ensuring the safety of devices.

The invention relates to the technical field of software testing, and provides a YOLO-based interface recognition and automatic testing method in a multi-system environment, which comprises the following steps of: performing recognition detection on a test software interface screenshot obtained through desktop screenshots by utilizing a pre-trained YOLO model; an RPA or ADB tool is adopted to realize automatic operation; performing a black box test, and verifying whether output results of the YOLO model under various inputs conform to expectation from the perspective of a user without paying attention to internal implementation details of a tool; carrying out white-box testing, and carrying out fine-grained testing on the YOLO model, the RPA operation script and the ADB tool command; and compiling a test script, and automatically executing identification and operation test. Through efficient and accurate recognition, powerful automatic operation, excellent real-time performance and a reliable exception handling mechanism, the software testing efficiency and accuracy are remarkably improved, and the method has wide application prospects and important technical value.

The invention discloses a distributed credential and credential privacy computing system, which belongs to the technical field of credential and credential security and comprises a security isolation module for dividing the privacy computing system into a data layer, a computing layer and an application layer which are isolated and communicated through an API (Application Program Interface) and an encryption protocol; the cloud side end collaborative operation framework bears operation penetrating through the privacy computing system, and the cloud center management node, the edge node and the credential desktop client cooperatively execute a distributed privacy computing task; the communication management module monitors a connection health state in real time and realizes fault self-recovery of a communication link by adopting a main and standby socket switching strategy; and the verification platform is used for testing and verifying the intelligent calculation algorithm, the communication logic and the system flow which are about to be executed or are being executed in a simulation environment based on a white-box test method. According to the method, on the premise that data privacy security is guaranteed, distributed computing power is fully utilized, complex intelligent tasks are stably and reliably completed, and continuous optimization can be achieved.

The invention discloses a chip testing method and device, equipment and a medium, and relates to the technical field of chip testing. The method comprises the following steps: building a chip firmware white-box test platform on a simulation platform, and registering at least one debugging tool chain through a preset standardized interface; executing the test case on the white-box test platform to obtain a basic test log, and triggering the debugging tool chain to synchronously collect multi-dimensional operation data in the execution process of the test case; and performing format unification and time axis alignment processing on the multi-source log data to generate standardized time axis data, performing association analysis on the standardized time axis data based on a preset association analysis algorithm, identifying abnormal behaviors and potential risks in the test process of the chip firmware, and displaying a corresponding analysis result through a visual interface. Through the technical scheme of the invention, the problems caused by difficulty in positioning probability problems, tool chain splitting and insufficient collaboration in a chip testing process can be solved.

The invention discloses a white-box test instrumentation method based on macro control, which constructs a stub code fusion management mechanism, fuses stub codes and macro definition into a header file, realizes standardization and structuring of the stub codes, provides a basis for subsequent stub code structured generation, automatic execution and stub code removal, and improves the efficiency of stub test. Standardized instrumentation positions and unified code styles are adopted, stub codes written by different testers can be standardized, the stub codes are integrated together in a macro definition mode, a mechanism that code macro definition is expanded in a pre-compiling stage is introduced, a standardized stub code template is combined, and the pre-compiling efficiency is improved. According to the method, pre-compiling processing is uniformly carried out on instrumentation codes in the compiling process, the stub codes are automatically executed in combination with the characteristics of Boolean variables, removal of the stub codes and closing of the stub codes in a test header file are supported through macro definition and the switching characteristics of the Boolean variables, and normal operation of a program is not affected in the process.

The application discloses a hardware white box test combination device and a test method thereof, and relates to the technical field of hardware white box testing.The test station module of the device comprises a computer, a top test area, a bottom test area and a high-voltage test area.The computer is used for managing traceability files and executing test procedures.A network switch comprises a plurality of network ports, and each network port is connected to other modules through a cable.The network switch is used for providing network communication for a printer, the test station module, an electronic tool cabinet and a test cabinet module.The printer is used for printing test cases.The electronic tool cabinet module is used for storing test tools.The test cabinet module comprises a digital multimeter, an oscilloscope, a camera, a high-voltage tester, a program-controlled power supply, a hygrothermograph, a code scanning gun, a probe, a mechanical arm, a rack and a cabinet body, and is used for providing a hardware white box test environment for a module to be tested.Based on the device, the test cost of the hardware white box can be reduced.