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Base station oriented millimeter wave end-to-end performance test system and method

A test system and test method technology, applied in transmission systems, transmission monitoring, electrical components, etc., can solve problems such as the inability to realize millimeter-wave end-to-end performance tests, achieve the effect of reducing test costs and supporting two-way tests

Active Publication Date: 2020-08-18
CHINA ACADEMY OF INFORMATION & COMM
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Problems solved by technology

[0004] The embodiment of the present application provides a base station-oriented millimeter wave end-to-end performance test system and method, which solves the problem that the existing terminal-oriented multi-probe test system cannot realize the base station-oriented millimeter wave end-to-end performance test

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[0036] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0037] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0038] figure 1 It is the conduction method test system of the prior art.

[0039] Communication equipment performance testing methods are mainly divided into two categories, nam...

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Abstract

The invention discloses a base station oriented millimeter wave end-to-end performance test system and method. The system comprises a base station darkroom module, an intermediate hardware module anda terminal darkroom module. The base station darkroom module comprises a base station darkroom, a base station to be detected in the base station darkroom and a spherical probe wall, and the probe wall is provided with a probe supporting uplink and downlink bidirectional communication and used for transmitting bidirectional signals between the base station to be detected and the intermediate hardware module; the intermediate hardware module comprises variable frequency power amplifier equipment and a channel simulator, supports time slot synchronization with the base station to be tested, andperforms uplink and downlink switching; wherein the terminal camera obscura module comprises a shielding camera obscura, a probe and a millimeter wave terminal, and the millimeter wave terminal receives downlink data, sends uplink data and completes end-to-end connection with a base station to be tested. The method is applied to the system and comprises the steps of a probe selection algorithm anda white box test method based on a base station beam filtering signal.

Description

technical field [0001] The present application relates to the technical field of wireless communication, and in particular to an end-to-end performance test system and test method supporting millimeter waves. Background technique [0002] There is a contradiction between the bandwidth requirements of ultra-high-speed data transmission and spectrum resources. 4G LTE technology cannot meet new communication requirements such as ultra-high-speed data transmission, high-reliability and low-latency connections, and the Internet of Everything. Therefore, millimeter-wave frequency bands with rich spectrum resources have become 5G An important choice for mobile communication systems, millimeter wave technology has also become one of the key technologies for 5G mobile communication. Performance testing is an important link in the development and mass production of communication equipment. The new generation of communication equipment using millimeter wave technology requires a corres...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/391H04B17/30H04B17/00
CPCH04B17/3912H04B17/30H04B17/0087
Inventor 乔尚兵李雷郭宇航王飞龙刘晓龙张翔吴翔张宇潘冲任宇鑫徐菲魏贵明
Owner CHINA ACADEMY OF INFORMATION & COMM
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