Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method, apparatus and equipment for fabric surface defect detection

A defect detection and fabric technology, applied in image data processing, instruments, calculations, etc., can solve problems such as low detection efficiency, labor-intensive detection, and inability to correct in real time, so as to improve detection efficiency, reduce false detection rate, and improve detection efficiency. The effect of accuracy

Inactive Publication Date: 2019-01-04
SHENZHEN LINTSENSE TECH CO LTD
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the case of a large fabric output, it will be very labor-intensive for the inspector to detect, and the inspector is prone to fatigue after working for a period of time, so there is a possibility of false detection
Therefore, the overall defect detection efficiency detected by inspectors is not high, and the detection accuracy is not stable enough
[0004] A small number of enterprises also use cloth inspection machines to detect, but the current cloth inspection machines do not have the ability of automatic learning. When a false detection occurs, it cannot be corrected in real time. When the same situation is encountered next time, the false detection will still occur again, resulting in Detection efficiency and detection accuracy are not high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method, apparatus and equipment for fabric surface defect detection
  • Method, apparatus and equipment for fabric surface defect detection
  • Method, apparatus and equipment for fabric surface defect detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] The subject matter described herein will now be discussed with reference to example implementations. It should be understood that the discussion of these implementations is only to enable those skilled in the art to better understand and realize the subject matter described herein, and is not intended to limit the protection scope, applicability or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as needed. For example, the methods described may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with respect to some examples may also be combined in other examples.

[0016] As used herein, the term "comprising" and its variants represent open terms meaning "including but not limited to". The...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method, apparatus and equipment for fabric surface defect detection are disclosed. The method includes: obtaining an image of a fabric to be detected; detecting the image to be detected by using a neural network model; if the detection result is a defect on the fabric surface corresponding to the image to be inspected, the detection result prompting information being generated; obtaining feedback information of the user to the detection result; if the feedback information is negative feedback information, a detection error value being calculated, and network parameters of the neural networkmodel being adjusted according to the detection error value. The method, the apparatus and the equipment can improve the fabric surface defect detection accuracy without manpower basically, and can obtain the feedback information of the detection result of the user in the fabric surface defect detection process, adjust the parameters of the neural network model in real time, reduce the false detection rate, and improve the detection efficiency.

Description

technical field [0001] The present application relates to the technical field of fabric detection, in particular to a detection method, device and equipment for fabric surface defects. Background technique [0002] In the production line of woven fabrics, knitted fabrics, non-woven fabrics, etc., it is necessary to detect whether there are surface defects in the produced fabrics, for example, whether there are stains, holes, fluff, etc. on the fabric. [0003] The current detection method is mainly that the inspectors stand in front of the cloth inspection equipment to find the surface defects of the fabric through visual inspection and mark or record the surface defects. In the case of a large fabric output, it will be very labor-intensive to be tested by the inspectors, and the inspectors are prone to fatigue after working for a period of time, so there is a possibility of false detection. Therefore, the overall defect detection efficiency detected by inspectors is not hi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0008G06T2207/20084G06T2207/30124
Inventor 金玲玲饶东升何文玮宋晓文
Owner SHENZHEN LINTSENSE TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com