Polaroid recessive defective light detection device and method
A technology of light detection and hidden defects, applied in the field of polarizers, can solve problems such as high incidence of hidden defects, low detection rate, and high loss of quality cost, so as to avoid huge cost loss and abnormal complaints from customers, and eliminate Batch output and outflow, realize the effect of identification and detection
Inactive Publication Date: 2019-01-11
SHENZHEN SAPO PHOTOELECTRIC
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[0011] The invention provides a light detection device and method for recessive defects of polarizers, which adopts a light source, a first optical device, a second optical device, and a third optical device arranged in sequence from left to right, and the light from the light source passes through the optical combination in sequence , measure the light intensity of the transmitted light under different optical axis angles of this optical combination, so as to obtain the best conditions for the display, inspection and identification of the hidden defects of the polarizer to solve the low detection rate and high incidence of hidden defects in the existing technology , the technical problem of high loss of quality cost
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[0025] Specific embodiments of the present invention are described with reference to the above drawings.
[0026] Depend on figure 2 It can be seen that the present invention provides a light detection device for latent defects in polarizers, which includes a light source 21, a first optical device 22, a second optical device 23, and a third optical device 24 arranged in sequence from left to right. The first optical device The device 22 includes at least one common Nor type polarizer, and the third optical device 24 includes at least one common Nor type polarizer, and the optical axis direction of the third optical device 24 is the same as that of the light of the first optical device 22. axis directions are parallel, the angle between the optical axis direction of the third optical device 24 and the optical axis direction of the first optical device 22 is 0±10 degrees, and the optical axis direction of the second optical device 23 and The optical axis direction of the thir...
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The invention provides a polaroid recessive defective light detection device and method. According to the device, a light source (21), a first optical device (22), a second optical device (23) and a third optical device (24) are sequentially provided from left to right, light of the light source sequentially transmits the optical combination, optimized conditions of revealing, examining and identifying polaroid recessive defects can be obtained by measuring the light intensity of the light transmitting the optical combination under different optical axis included angles, and the technical problems of low detection rate, high recessive rejection occurrence rate and large quality cost consumption in the prior art can be solved, polaroid recessive defects can be identified and detected, batchoutput and outflow of poloid recessive defects can be effectively stopped, the technical effects of improving detection rate and reducing cost can be achieved.
Description
technical field [0001] The present invention relates to the field of polarizers, in particular to a light detection device and method for hidden defects of polarizers. Background technique [0002] Existing inspection methods for inspecting polarizer defects use reflection and polarized light detection methods, that is, the principle of orthogonal transmission to inspect polarizers. [0003] Reflection inspection method: Use the diffuse reflection method in which parallel light hits the uneven surface and the reflected light shoots in all directions to inspect the uneven defects on the polarizer. [0004] Polarized light inspection method: use linearly polarized light to project the polarizer to be inspected, and slowly rotate the polarizer to be inspected around the direction of light propagation, which will form a light intensity change phenomenon from strong to weak, from weak to strong, using this light intensity The change phenomenon shall be inspected for defects of t...
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Login to View More IPC IPC(8): G01N21/95G01N21/01
CPCG01N21/01G01N21/95G01N2021/9511
Inventor 王莹杨菊花曹凯凯张碧霞林明清
Owner SHENZHEN SAPO PHOTOELECTRIC