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Vacuum micro-discharge test testing device and method

A test and micro-discharge technology, which is applied in the test field, can solve the problems that the harmonic detection method cannot meet the technical requirements of high-frequency harmonic detection and the transmission power capacity is insufficient.

Inactive Publication Date: 2019-01-11
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] (1) The harmonic detection method used in the low frequency band cannot meet the technical requirements for harmonic detection in the high frequency band;
[0009] (2) Insufficient transmission power capacity

Method used

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  • Vacuum micro-discharge test testing device and method
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  • Vacuum micro-discharge test testing device and method

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Embodiment Construction

[0045] It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs.

[0046] It should be noted that the terminology used herein is only for describing specific embodiments, and is not intended to limit the exemplary embodiments according to the present disclosure. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0047] figure 2 It is a structural schematic diagram of an embodiment of a vacuum microwave discharge test device of the pres...

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Abstract

The invention provides a vacuum micro-discharge test testing device and a method. The vacuum micro-discharge test testing device comprises a signal generator configured to generate an excitation signal which is required for a tested piece in a vacuum micro-discharge test. The tested piece is arranged in a vacuum environment. The input end of the tested piece is connected with the signal generator,and the output end of the tested piece is connected with a waveguide fundamental wave monitoring coupler. The waveguide fundamental wave monitoring coupler is configured to coupledly output the fundamental wave of the output signal of the tested piece. The output end of the waveguide harmonic wave monitoring coupler is serially connected with a waveguide harmonic wave monitoring coupler and a waveguide load. The waveguide harmonic wave monitoring coupler is connected with the harmonic wave spectrum monitoring device. The waveguide harmonic wave monitoring coupler is configured to coupledly output a set number of harmonic wave signals of an output signal of the tested device.

Description

technical field [0001] The disclosure belongs to the technical field of testing, and in particular relates to a testing device and method for a vacuum micro-discharge test. Background technique [0002] The statements in this section merely provide background information related to the present disclosure and do not necessarily constitute prior art. [0003] The micro-discharge effect, also known as the secondary electron multiplication effect, refers to the secondary electron emission and multiplication effect excited by free electrons between two metal surfaces or on the surface of a single medium under the acceleration of an external radio frequency field under vacuum conditions. This vacuum resonance discharge phenomenon is a very important factor affecting the reliability of space electronic equipment. [0004] The microdischarge effect mainly occurs in the radio frequency, microwave, and millimeter wave systems of the spacecraft. A spacecraft working normally in space...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 雷卫平郭荣斌郭敏段志强
Owner CHINA ELECTRONIS TECH INSTR CO LTD