Precision machining method for terahertz waveguide flange

Abstract

The invention discloses a precision machining method for a terahertz waveguide flange and belongs to the field of terahertz. By means of a precision positioning clamping fixture, the method disclosedby the invention solves the problems that an existing method has larger perpendicularity deviation and that the corresponding position accuracy between a waveguide pin hole and a waveguide cavity cannot be ensured. A precision positioning milling fixture is utilized, so that the mutual position relation between the terahertz waveguide flange and the waveguide opening can be effectively ensured, the perpendicularity between a pin and a flange end face is ensured, and butt joint accuracy and test indexes of a waveguide device are ensured. By means of the precision machining method disclosed by the invention, precision machining on the terahertz waveguide flange is achieved, product homogeneity and production efficiency are simultaneously improved, and economic and social benefits are obvious.

Description

technical field [0001] The invention belongs to the technical field of terahertz, and in particular relates to a precision machining method of a terahertz waveguide flange. Background technique [0002] Waveguide components, including straight waveguides, curved waveguides, waveguide antennas, directional couplers, etc., are widely used devices in the microwave testing industry. In the testing process, the transmission performance and efficiency of the waveguide have a great influence on the overall test index, and the device connection in this process depends entirely on the waveguide flange surface and pins for precise positioning. The flange surface of the waveguide and the pin hole are an important link in the assembly of waveguide devices. The perpendicularity between the flange surface and the waveguide cavity and the position accuracy of the pin hole relative to the waveguide cavity will affect the accuracy of the docking and power loss. [0003] In the terahertz mic...

AI Technical Summary

Problems solved by technology

[0003] In the terahertz microwave test system, we have applied straight waveguides, curved waveguides, and directional couplers in the terahertz frequency band. During the test of these waveguide devices, due to the verticality deviation between the flange surface and the waveguide cavity, the waveguide devices will be docked. Afterwards, a gap will be generated, resulting in signal leakage. At the same time, the positional deviation of the pin hole relative to the waveguide cavity will cause the mutual misalignment between the docked waveguide cavities, and will also cause the power loss of the transmitted signal. Such deviation will affect the subsequent debugging and testing. Calibration, and during application of the test system, affects test precision and accuracy

[0004] The main problems of the existing method are: in the milling process of the waveguide flange, the deviation of the perpendicularity between the flange surface and the waveguide cavity is large, and the relative position accuracy between the waveguide pin hole and the waveguide cavity cannot be guaranteed, resulting in the waveguide device docking and testing process. The power loss is large and even affects the test and calibration accuracy

[0006] Since the shape is used as the processing positioning reference, there are problems such as dimensional deviation and dimensional consistency in the shape, and the influence of factors such as the verticality deviation between the waveguide cavity and the worktable plane designed by milling, the surface of the waveguide flange after milling is opposite to the pin hole. Due to the poor verticality of the waveguide cavity, there are also problems such as poor position accuracy of the pin hole relative to the waveguide cavity, which affects the docking accuracy and test performance indicators of the waveguide device, and the processing accuracy is poor in consistency and the production efficiency is not high.

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