An inspection device

A technology for inspecting devices and inspecting objects, applied to measuring devices, material analysis through optical means, instruments, etc., can solve problems such as complex calculations and processing

Active Publication Date: 2019-01-15
NIDEC TOSOK CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Therefore, arithmetic processing for defec

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Example Embodiment

[0021] Next, an exemplary embodiment of the inspection apparatus and inspection method of the present invention will be described with reference to the drawings. The inspection apparatus and inspection method of the present invention are an apparatus and method for performing visual inspection of the inspection surface included in the outer peripheral surface of the inspection object. Hereinafter, the direction parallel to the thickness direction and the axis of the inspection object is referred to as the "axial direction", and the direction perpendicular to the axial direction is referred to as the "radial direction", and will be along a circle centered on the axis of the inspection object. The direction is called "circumferential" for description.

[0022]

[0023] The inspection apparatus 1 of the present embodiment automatically performs visual inspection for detecting defects such as dents on the surface of the inspection object 100 having a thickness in the axial direction....

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Abstract

An inspection device is provided. This inspection device is a device that performs visual inspection of the surface to be inspected included in the inspection object. The inspection device includes anirradiation device, an imaging device, an image storage unit, and a defect detecting unit. The illuminating device moves on an imaginary plane along the surface of the object to be inspected, and illuminates the surface of the object to be inspected toward the object to be inspected. The imaging device includes the inspection surface of the inspection object in the imaging range, receives the light reflected at the inspection surface, and generates a luminance distribution image as an imaging result. The image storage unit stores a plurality of brightness distribution images captured by the imaging device at a plurality of timings in which the positions of the irradiation devices are different and the inspection surface, the imaging device, and the irradiation device are not arranged in astraight line. The defect detecting unit detects a defect on the surface to be inspected based on a plurality of different brightness distribution images.

Description

technical field [0001] The present invention relates to inspection devices. Background technique [0002] Conventionally, there are known inspection devices used to automatically inspect whether or not there is a defect such as a dent on an inspection surface of an inspection object. Such an inspection device is disclosed in, for example, Japanese Patent Application Laid-Open No. 2007-33236. [0003] The surface defect inspection device described in Japanese Patent Application Laid-Open No. 2007-33236 is composed of an illumination unit, an imaging unit, a light source control device, and a defect inspection device. The lighting unit is composed of a plurality of light sources (1a-1f) arranged in sequence on a curved surface. The plurality of imaging units are composed of a plurality of imaging devices (2a to 2f) arranged sequentially on the curved surface. A light source control device (4) selects one light source from among a plurality of light sources in the lighting u...

Claims

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Application Information

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IPC IPC(8): G01N21/88
CPCG01N21/88G01N21/8806G01N21/8851G01N2021/8838G01N2021/8893G01N2201/061G01N2201/102
Inventor 野村昭农宗千典
Owner NIDEC TOSOK CORP
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