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Automatic early warning method and device, computer device and storage medium for testing defects

An automatic early warning and defect technology, applied in alarms, digital transmission systems, instruments, etc., can solve the problem of long repair time for test defects

Active Publication Date: 2019-01-25
PING AN TECH (SHENZHEN) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The embodiment of the present invention provides an automatic early warning method, device, computer equipment and storage medium for test defects to solve the problem of long repair time for test defects

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  • Automatic early warning method and device, computer device and storage medium for testing defects
  • Automatic early warning method and device, computer device and storage medium for testing defects

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0029] The test defect automatic early warning method provided by the embodiment of the present invention can be applied in such as figure 1 In the application environment, that is, the test defect automatic warning method is applied to the test defect statistics system. The test defect statistics system includes a server, a client and a project management system. The server communicates with the client and the project management system through the netw...

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Abstract

The invention discloses a test defect automatic early warning method and device, a apparatus and a medium. The method comprises: acquiring defect data from a project management system, wherein the defect data corresponds to a defect grade and a developer interface; If the defect level is greater than the preset level, acquiring a first reminding frequency, and sending a first reminding message toa developer interface corresponding to the defect data according to the first reminding frequency; If the defect level is not greater than the preset level, counting the number of defect data corresponding to each developer interface; If the number of defect data is greater than the preset number, obtainingthe second reminder frequency and sending a second reminder message to the developer interface according to the second reminder frequency. If the defect level is not greater than the preset level and the number of defect data is not greater than the preset number, obtaining the test defect statistics report at regular intervals, and sending the test defect statistics report to the monitoring personnel interface, so that the defect data can be repaired in time by reminding message, and the repair efficiency can be improved.

Description

technical field [0001] The invention relates to the field of software testing, in particular to an automatic early warning method, device, computer equipment and storage medium for testing defects. Background technique [0002] At present, most project management systems do not have an intuitive and effective monitoring method for test defects. When a test defect occurs, developers cannot quickly obtain the test defect. Usually, the developer obtains all the defect data at a fixed time, and then repairs the defect data, so that the test defect cannot be repaired in time, which makes the test defect repair time longer. Contents of the invention [0003] The embodiments of the present invention provide an automatic early warning method, device, computer equipment and storage medium for test defects, so as to solve the problem of long repair time for test defects. [0004] An automatic early warning method for test defects, comprising: [0005] Acquiring defect data from a ...

Claims

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Application Information

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IPC IPC(8): H04L12/24H04L12/26G08B21/24
CPCH04L41/0631H04L43/06H04L43/08G08B21/24Y02P90/30
Inventor 黄锦伦
Owner PING AN TECH (SHENZHEN) CO LTD
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