A switch matrix for conduction immunity test of electric power intelligent equipment
A technology for intelligent equipment and test switches, which is applied to the components of electrical measuring instruments, measuring electronics, and measuring devices, and can solve problems such as reducing test efficiency, switching matrix failure, and switching matrix conduction immunity testing.
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Embodiment 1
[0018] In the embodiment of the present invention, the switch matrix such as figure 1 As shown, it mainly includes the test bus composed of the positive pole of the test line (L), the negative pole of the test line (N), and the test ground (PE); Five sets of high-voltage switches, namely power supply (POWER), current signal (CT), voltage signal (PT), input port (IN) and output port (OUT). Among them, the power switch group consists of power input nodes (POWERIN+, POWERIN-), power output to bus nodes (POWER+, POWER-) and power output to external nodes (SPOWER+, SPOWER-); the current switch group consists of current input nodes (CTIN+ , CTIN-), current output to bus nodes (CT+, CT-), current output to external nodes (SCT+, SCT-); voltage switch group consists of voltage input nodes (PTIN+, PTIN-), voltage output to bus nodes ( PT+, PT-), voltage output to external nodes (SPT+, SPT-); the input switch group consists of input input nodes (ININ+, ININ-), input output to bus nodes ...
Embodiment 2
[0022] The switch matrix of the present invention can be applied to various conduction immunity tests, and forms an automatic test system with a disturbance generator (GENERATOR) and auxiliary equipment (AE), which reduces the labor cost of the EMC test, shortens the EMC test time, and It can improve the consistency of the same experimental test of similar devices under test.
[0023] Using the switch matrix designed by the present invention to realize the different control methods of conduction immunity test, such as figure 2 Shown, including the following two:
[0024] (1) Connect the output port of the auxiliary equipment (AE) to the interference generator (GENERATOR) through the switch matrix 1, and connect the tested port of the equipment under test (EUT) to the interference generator (GENERATOR) in series through the switch matrix 2, Apply a disturbance to it for a conducted immunity test.
[0025] figure 2 Take the output port (OUT) as an example to apply interfere...
Embodiment 3
[0031] The switch matrix designed in the present invention can realize the switching of the test port of the device under test through the multi-channel switching and breaking of the switch group.
[0032] figure 2 It is the state when testing the output port (OUT) of the equipment under test (EUT), that is, the output port is connected to the interference generator (GENERATOR) in series, image 3 In order to test the state of the current port (CT) of the equipment under test (EUT), that is, the current port is connected to the interference generator (GENERATOR) in series, the figure 2 The switch group state in the switch to image 3 The state of the middle switch group realizes the switching of the test port from the output port to the current port. Taking this process as an example, the switching between other test ports is the same. The process is as follows:
[0033] (1) The output switch group of switch matrix 1 is from figure 2 State 2 in the ON bus state switches t...
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