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A switch matrix for conduction immunity test of electric power intelligent equipment

A technology for intelligent equipment and test switches, which is applied to the components of electrical measuring instruments, measuring electronics, and measuring devices, and can solve problems such as reducing test efficiency, switching matrix failure, and switching matrix conduction immunity testing.

Active Publication Date: 2020-12-22
NANJING NARI GROUP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At this stage, the conduction immunity test is mainly done manually by the testing engineer. The main reason is that there are various devices under test, different devices have different ports under test, and different ports under test have different wiring methods. When testing different ports Frequent line change and wiring operations are required, which seriously reduces the test efficiency; the switch matrix used in the automatic test cannot pass the conduction immunity test, which makes the switch matrix fail during the test, and crosstalk between adjacent switches will cause the output The disturbance waveform does not meet the standard requirements

Method used

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  • A switch matrix for conduction immunity test of electric power intelligent equipment
  • A switch matrix for conduction immunity test of electric power intelligent equipment
  • A switch matrix for conduction immunity test of electric power intelligent equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] In the embodiment of the present invention, the switch matrix such as figure 1 As shown, it mainly includes the test bus composed of the positive pole of the test line (L), the negative pole of the test line (N), and the test ground (PE); Five sets of high-voltage switches, namely power supply (POWER), current signal (CT), voltage signal (PT), input port (IN) and output port (OUT). Among them, the power switch group consists of power input nodes (POWERIN+, POWERIN-), power output to bus nodes (POWER+, POWER-) and power output to external nodes (SPOWER+, SPOWER-); the current switch group consists of current input nodes (CTIN+ , CTIN-), current output to bus nodes (CT+, CT-), current output to external nodes (SCT+, SCT-); voltage switch group consists of voltage input nodes (PTIN+, PTIN-), voltage output to bus nodes ( PT+, PT-), voltage output to external nodes (SPT+, SPT-); the input switch group consists of input input nodes (ININ+, ININ-), input output to bus nodes ...

Embodiment 2

[0022] The switch matrix of the present invention can be applied to various conduction immunity tests, and forms an automatic test system with a disturbance generator (GENERATOR) and auxiliary equipment (AE), which reduces the labor cost of the EMC test, shortens the EMC test time, and It can improve the consistency of the same experimental test of similar devices under test.

[0023] Using the switch matrix designed by the present invention to realize the different control methods of conduction immunity test, such as figure 2 Shown, including the following two:

[0024] (1) Connect the output port of the auxiliary equipment (AE) to the interference generator (GENERATOR) through the switch matrix 1, and connect the tested port of the equipment under test (EUT) to the interference generator (GENERATOR) in series through the switch matrix 2, Apply a disturbance to it for a conducted immunity test.

[0025] figure 2 Take the output port (OUT) as an example to apply interfere...

Embodiment 3

[0031] The switch matrix designed in the present invention can realize the switching of the test port of the device under test through the multi-channel switching and breaking of the switch group.

[0032] figure 2 It is the state when testing the output port (OUT) of the equipment under test (EUT), that is, the output port is connected to the interference generator (GENERATOR) in series, image 3 In order to test the state of the current port (CT) of the equipment under test (EUT), that is, the current port is connected to the interference generator (GENERATOR) in series, the figure 2 The switch group state in the switch to image 3 The state of the middle switch group realizes the switching of the test port from the output port to the current port. Taking this process as an example, the switching between other test ports is the same. The process is as follows:

[0033] (1) The output switch group of switch matrix 1 is from figure 2 State 2 in the ON bus state switches t...

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Abstract

The invention discloses a conduction inference immunity test switch matrix of power intelligent equipment. The matrix comprises a test bus formed by a test circuit positive pole, a test circuit negative pole and three test lines of a test ground. A switch group is connected between the test circuit positive pole and the test circuit negative pole in a crossing manner and includes high-voltage switches corresponding to one or more ones among a plurality of ports of power intelligent equipment; each high-voltage switch includes an input node, an output-to-bus node and an output-to-outside node;and the input node has three states including an off state, a state of connecting to the output-to-bus node, and a state of connecting to the output-to-outside node. According to the switch matrix, onthe basis of multi-channel switching of the switch group, rapid and automatic wiring of different tested ports is realized.

Description

technical field [0001] The invention relates to the technical field of electromagnetic compatibility testing of electric power intelligent equipment, in particular to a switch matrix for conduction immunity testing of electric power intelligent equipment. Background technique [0002] Conducted immunity tests include electrical fast transient burst immunity, surge (shock) immunity, damped oscillatory wave immunity, ringing wave immunity and radio frequency induced conducted disturbance immunity, etc. It is an important part of electromagnetic compatibility testing. At this stage, the conduction immunity test is mainly done manually by the testing engineer. The main reason is that there are various devices under test, different devices have different ports under test, and different ports under test have different wiring methods. When testing different ports Frequent line change and wiring operations are required, which seriously reduces the test efficiency; the switch matrix...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R1/04
CPCG01R1/0408G01R31/001
Inventor 朱崇铭傅静波肖保明张梅沈雪梅姜宁浩鞠文静钱佳斌吴可王鹏陈扬阳袁春牧毛志鹏相海明
Owner NANJING NARI GROUP CORP