The invention discloses a temperature characteristic testing method for a high-power short-wave
LDMOS solid-state power
amplifier. Comprising a high-power short-wave
LDMOS solid-state power
amplifier direct-current temperature characteristic test, a high-power short-wave
LDMOS solid-state power
amplifier RF large-
signal temperature characteristic test, a high-power short-wave LDMOS solid-state power amplifier dual-tone power and
intermodulation temperature characteristic test and a high-power short-wave LDMOS solid-state power amplifier second /
third harmonic temperature characteristic test. According to the core of the invention, a
signal generator, a direct-current power supply, an alternating-current power supply, a digital power meter, a frequency
spectrograph, an attenuator, a load, a temperature box and the like are adopted to realize the temperature characteristic test of the high-power short-wave LDMOS solid-state power amplifier. These instruments have the ability to test drain-source current Ids, output power Pout,
gain Gain,
power added efficiency PAE, dual-tone power,
intermodulation, and second and
third harmonic temperature parameters. Compared with other traditional testing technologies, the technology has the advantages of being high in accuracy, high in
operability and the like. According to the invention, the temperature characteristic of the high-power short-wave LDMOS solid-state power amplifier can be effectively tested, and important guidance can be provided for the
reliability design of the short-wave LDMOS solid-state power amplifier.