Three-dimensional angularity detection system and detection method

A detection system, angular technology, applied in the analysis of materials, instruments, etc., can solve the problem of inaccurately characterizing the overall angularity of particles, and achieve the effect of improving the accuracy of characterization

Pending Publication Date: 2019-03-01
HUAQIAO UNIVERSITY
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Problems solved by technology

Although the above-mentioned methods can characterize the two-dimensional angularity of the particles, because the angularity of the particles is three-dimensional after all, the two-dimensional angularity obtained only through the particle outline of the image method cannot accurately characterize the overall angularity of the particles. Therefore, it is necessary to propose a three-dimensional angularity algorithm to characterize the overall angularity of particles

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  • Three-dimensional angularity detection system and detection method
  • Three-dimensional angularity detection system and detection method
  • Three-dimensional angularity detection system and detection method

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Embodiment Construction

[0034] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0035] refer to figure 2 , a three-dimensional angularity detection system, including: a microscope lens module 201, an X / Y-axis electric stage device 202, a Z-axis electric focusing device 203, a three-dimensional image stitching module 207, and an angularity detection module 208, said The microscope lens module 201 includes a general zoom lens, a light source 204 and a camera;

[0036] The Z-axis electric focusing device 203 drives the microscope lens module 201 to move up and down in a direction perpendicular to the upper surface of the X / Y-axis electric stage device 202; the X / Y-axis electric stage device 202 moves along a direction parallel to its upper surface; the microscope lens module 201 is equipped with a light source 204 on one side of the upper surface of the X / Y axis motorized stage device 202;

[003...

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Abstract

The invention provides a three-dimensional angularity detection system and detection method. A Z-axis electric focusing device drives a microscope lens module to move up and down in a direction perpendicular to the upper surface of an X / Y-axis electric stage device; the X / Y-axis electric stage device moves in a direction parallel to the upper surface of the X / Y-axis electric stage device; a powersource is mounted on one side, facing the upper surface of the X / Y-axis electric stage device, of the microscope lens module; the microscope lens module is connected with a three-dimensional image mosaic module through a transmission line, and images, shot at different heights by the microscope lens module, of to-be-detected particles on a stage are sent to the three-dimensional mosaic module andsubjected to mosaic processing to form three-dimensional data points; the three-dimensional image mosaic module sends the three-dimensional data points to an angularity detection module to determine three-dimensional angularity of the to-be-detected particles. By application of the microscope technique to particle morphological feature detection, accuracy in representation of particle angularity is improved.

Description

technical field [0001] The invention relates to the field of engineering machinery, in particular to a method and system for detecting three-dimensional angularity. Background technique [0002] At present, there are two-dimensional and three-dimensional methods for measuring the angularity of particles. Two-dimensional measurement uses the image method to obtain the particle boundary contour through image filtering, image binarization, image filling and other image morphology processing, and then characterizes the angularity of the particles through the related two-dimensional angularity characterization method. Currently, two-dimensional Angularity measurement methods include: image erosion-expansion method, the larger the value of the surface parameter, the greater the angularity; the Fourier series method of the contour radius, the contour radius R(θ) can be expanded by Fourier series , the particle angularity and its angular significance index a r It is directly propo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00
CPCG01N15/00
Inventor 房怀英朱合军杨建红范伟林继铭蔡园园黄晓宇
Owner HUAQIAO UNIVERSITY
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