Low light level image intensifier test system

Abstract

The invention discloses a low light level image intensifier test system which comprises a test box for containing the tested low light level image intensifier, a test power supply assembly for providing a working power supply to the tested low light level image intensifier, an illumination assembly for providing a test optical signal input to the tested low light level image intensifier, and a recording assembly for receiving an output optical signal generated by the tested low light level image intensifier based on the test optical signal input and converting the output optical signal into atest electrical signal and recording the voltage data of the test electrical signal. The illumination assembly comprises a light emitting device for emitting the test optical signal and a light guidedevice for transmitting the test optical signal; the test power supply assembly, the light emitting device and the recording assembly are all arranged outside the test box, the light guide device is arranged inside the test box and is used for transmitting the test light signal emitted by the light emitting device to the tested low light level image intensifier as the input of the test light signal.

Description

technical field [0001] The invention relates to the field of optoelectronic technology, in particular to a low-light image intensifier test system for performing high and low temperature illumination tests on the low-light image intensifier. Background technique [0002] The low-light image intensifier is mainly composed of a high-voltage power supply and an image intensifier tube. It belongs to a high-voltage electric vacuum device and has important applications in military, scientific research and other fields. Real-world applications often require that the image intensifier can work normally in extreme environments without any problems, so it is necessary to use a test system with variable temperature and variable illumination to test the quality of the image intensifier. [0003] In order to check the quality and reliability of the image intensifier and its high-voltage power supply, in actual production, the high-low temperature test system is usually used to test the h...

AI Technical Summary

Problems solved by technology

This method uses two different test systems before and after, so the test process may be too complicated and take up more resources. In addition, there may be many problems as follows:

With this method, only one image intensifier can be tested at a time, and the testing efficiency is very low

[0006] 3. The existing input light with different light intensities is selected through filters and shading films with different attenuation. The range of light intensity that can be realized is narrow, and the light can not change linearly, and the light can not be set according to the program. Automatic changes are not conducive to scientific research and testing

However, the failure rate of pinhole printers is high, the whole system is complex and huge, and the recording depth is limited. For example, a few hours of depth recording of the image intensifier will consume a lot of paper

Moreover, the sampling rate of such a test system is low, and it is difficult to capture occasional transient faults

The test data cannot be exported, and subsequent comparison and analysis of the data cannot be performed

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