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X-ray high voltage power supply fault prediction method based on wavelet decomposition and LSTM

A high-voltage power supply and wavelet decomposition technology, which is applied in power supply testing, character and pattern recognition, biological neural network models, etc., can solve problems such as long development cycle and poor long-term fault prediction accuracy, and achieve enhanced perception, great social value and Practical significance, the effect of ensuring safe operation

Inactive Publication Date: 2019-03-19
XIDIAN UNIV
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Problems solved by technology

[0003] To sum up, the problems existing in the existing technology are: the long-term prediction accuracy of the traditional fault prediction technology is very poor; the expert system requires a lot of practice and accumulation, and the development cycle is very long

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  • X-ray high voltage power supply fault prediction method based on wavelet decomposition and LSTM
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  • X-ray high voltage power supply fault prediction method based on wavelet decomposition and LSTM

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[0042] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0043] The present invention is based on wavelet decomposition and LSTM X-ray high-voltage power supply fault prediction method to make up for the poor long-term prediction accuracy of traditional fault prediction technology; the expert system needs a lot of practice and accumulation, and the development cycle is very long; the present invention It has strong generalization ability and achieves high prediction accuracy; based on a large number of current change data and temperature change data of X-ray high-voltage power supply, a fault prediction model of X-ray high-voltage power supply based on wavelet decomposition and LS...

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Abstract

The invention belongs to a test device for electrical performance, relates to the technical field of electrical fault detection devices, and discloses a X-ray high voltage power supply fault prediction method based on wavelet decomposition and LSTM. The state change data {y1, y2,. . . , yt-1, yt} of an X-ray high voltage power supply is used as an initial sequence, respectively, the wavelet decomposition is conducted on the sequence before the first t-1 moments, and the subsequences {Dj, j = 1, 2,. . . , n} of the wavelet decomposition at different scales are obtained; the data of the t-1 moments of the n subsequences is used for establishing the LSTM model for training and prediction, and the prediction result of each subsequence at t moment is obtained; linearly superimposing is conducted on the prediction results of each subsequence at t moment to obtain a predicted value at t moment of a power state sequence; the relative error between the prediction result and a true value is calculated, and the prediction result is verified and evaluated. The method utilizes the advantages of the LSTM model by the wavelet decomposition, improves the prediction precision, has a high generalization ability, and has a great social value and practical significance.

Description

technical field [0001] The invention belongs to the technical field of electrical performance testing device and electrical fault detection device, and in particular relates to an X-ray high-voltage power supply fault prediction method based on wavelet decomposition and LSTM. Background technique [0002] At present, the existing technologies commonly used in the industry are as follows: with the development of the information age, industrial development is becoming more and more modernized, and the performance of various types of large and complex equipment that plays a major role in various fields is constantly improving and the complexity of system composition The continuous increase makes the safety reliability, maintainability, fault prediction and diagnosis of large and complex equipment more and more important in various fields such as aviation, aerospace, communication and industrial applications. Therefore, based on massive data, the prediction of equipment failure ...

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Application Information

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IPC IPC(8): G01R31/40G06N3/04G06K9/00
CPCG01R31/40G06N3/045G06F2218/06
Inventor 张建龙李月卢毅王斌
Owner XIDIAN UNIV