Check patentability & draft patents in minutes with Patsnap Eureka AI!

A highlight object surface defect detection system and method based on reflected light

A technology for object surface and defect detection, which is applied in image data processing, instruments, calculations, etc., can solve the problems of difficult defect detection, eliminate defect feature weakening in high light areas, etc., achieve simple parameter adjustment, low hardware cost, and good detection effect Effect

Pending Publication Date: 2019-04-05
SOUTH CHINA UNIV OF TECH
View PDF14 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Now the more common method is to use filters such as polarizing lenses and an effective light source to eliminate the high-light area for detection, but the elimination of the high-light area will easily cause the weakening of defect characteristics, and it is difficult to detect some subtle defects, which has become a restriction for some industries. An important bottleneck for automatic detection of machine vision equipment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A highlight object surface defect detection system and method based on reflected light
  • A highlight object surface defect detection system and method based on reflected light
  • A highlight object surface defect detection system and method based on reflected light

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0049] like figure 1 As shown, a high-gloss object surface defect detection system based on reflected light includes a controller, a reflected light receiving board, a linear light source 2, a transmission device, a clamping device 4 and a camera 1. In this embodiment, the camera is located on the reflected light receiving board , the reflected light receiving plate is within the field of view of the camera. The positions of the linear light source, the camera, and the reflected light receiving plate 6 in the present invention are not fixed, and can be set according to specific circumstances, as long as the outgoing light 3 of the linear light source is directly irradiated to the detection position when the workpiece to be measured is transported to the detection position. Measure the surface of the workpiece. Since the workpiece to be measured is a high-gloss object, the reflected light receiving plate receives the reflected light 5 on the surface of the workpiece to be measu...

Embodiment 2

[0087] like figure 2 As shown, a high-gloss object surface defect detection system based on reflected light includes a reflected light receiving plate, a linear light source and a camera. In this embodiment, the linear light source emits at a small angle and directly hits the surface of the workpiece 9 to be tested. There is a hole in a suitable position, and the reflected light is reflected to the opaque reflected light receiving plate at the rear through the hole 8, and a picture sequence with complete reflected light is collected by the camera and input to the controller for detection.

[0088] This embodiment uses low-angle outgoing light for reflection, so as long as the surface of the workpiece to be tested has a continuous curvature, the reflected light will be displayed in the form of an approximate straight line, achieving the effect of turning the curve into a straight line, which is more conducive to the subsequent detection.

[0089] Other features are the same as...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a highlight object surface defect detection system and method based on reflected light. Including a controller, Reflective light receiving plate, Linear light source and camera, the to-be-detected workpiece is conveyed to a detection position; The linear light source is arranged on the surface of the workpiece to be detected, emergent light of the linear light source directly irradiates the surface of the workpiece to be detected, at the moment, the reflected light receiving plate receives reflected light rays on the surface of the workpiece to be detected, the reflected light receiving plate adjusts the workpiece to be detected in the collection view of the camera, the linear light can traverse the whole area to be detected, and the camera collects image sequencescontaining the reflected light rays and inputs the controller. Reflected light is used for detecting the surface of the high-light object, defects on the surface of the object can be amplified by increasing the distance between a reflection point and a reflection receiving plane, and the detection result is more accurate.

Description

technical field [0001] The invention relates to the field of digital image processing, in particular to a system and method for detecting surface defects of high-gloss objects based on reflected light. Background technique [0002] Machine vision technology is the process of using the image acquisition system to convert images into digital signals, and then using the host computer to analyze the digital relationship between digital images, and finally extracting and analyzing image features to achieve human goals. However, due to the strong reflection of light on the surface of the high-gloss object, the required object features are covered to a certain extent. The more common method now is to use filters such as polarizing lenses and effective light sources to eliminate high-light areas for detection, but the elimination of high-light areas can easily cause the weakening of defect characteristics, and it is difficult to detect some subtle defects, which has become a restric...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00
CPCG06T7/0008G06T2207/20032
Inventor 杜娟赵欢胡跃明
Owner SOUTH CHINA UNIV OF TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com