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Low-disturbance supporting structure for TEM small chamber

A support structure, low-disturbance technology, applied in the measurement of interference from external sources, measuring devices, instruments, etc., can solve the problems of the placement of insulating pads affecting the field environment and affecting the accuracy of conversion coefficients, etc.

Inactive Publication Date: 2019-04-19
NORTHWEST INST OF NUCLEAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to solve the technical problem that the placement of insulating pads affects the TEM standard field environment, thereby affecting the accuracy of the calibrated conversion coefficient

Method used

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  • Low-disturbance supporting structure for TEM small chamber
  • Low-disturbance supporting structure for TEM small chamber
  • Low-disturbance supporting structure for TEM small chamber

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] Such as figure 1 , figure 2 As shown, a low-disturbance support structure for a TEM cell in this embodiment includes two fixing slot blocks 1 , three nylon screws 4 , a carrier plate 5 , three wire loops 6 and three wires 7 .

[0050] Such as Figure 10 , Figure 11 As shown, one side of the two fixing groove blocks 1 is provided with a groove 11, and the other side is provided with a plurality of locking holes 12 side by side. a relative edge.

[0051] Such as Figure 12 , Figure 13 As shown, in this embodiment, the carrying plate 5 is a hollow structure, which is used to place the tested product or the calibrated detector; three connecting holes 51 are arranged on the edge of the carrying plate 5, and the interval between the connecting holes 51 is 120°; other In the embodiment, the connecting holes 51 can also be evenly arranged on the edge of the carrier plate 5, and the interval between adjacent connecting holes 51 is 15°. The connecting hole 51 is connect...

Embodiment 2

[0055] Such as image 3 , Figure 4 As shown, a low-disturbance support structure for a TEM cell in this embodiment includes two fixing slot blocks 1 , four nylon screws 4 , a carrier plate 5 , four wire loops 6 and four wires 7 .

[0056] Such as Figure 10 , Figure 11 As shown, one side of the two fixing groove blocks 1 is provided with a groove 11, and the other side is provided with a plurality of locking holes 12 side by side. a relative edge.

[0057] Such as Figure 12 , Figure 13 As shown, in this embodiment, the carrying plate 5 is a hollow structure for placing the test object or the calibrated detector; four connecting holes 51 are arranged on the edge of the carrying plate 5, and the interval angles between the connecting holes 51 are α, 180° -α, α, 180°-α, in this embodiment, α is selected as 90°, in other embodiments, in order to prevent the carrier plate (5) from tipping, wherein 60°<α<120°, when considering the symmetry, It can be 60°<α≤90°; in other e...

Embodiment 3

[0079] Such as Figure 5 , Figure 6 As shown, a low-disturbance support structure for a TEM cell in this embodiment includes four fixed slot blocks 1, six nylon screws 4, a carrier plate 5, six wire loops 6 and six wires 7; Considering that the TEM cell is affected by wind factors in the working environment, this embodiment adds two fixing slot blocks 1 , two nylon screws 4 , two wire loops 6 and two wires 7 on the basis of Embodiment 2.

[0080] In this example, if Figure 10 , Figure 11 As shown, one side of the four fixing slot blocks 1 is provided with a groove 11, and the other side is provided with a plurality of locking holes 12 side by side. The two opposite edges of the middle pole plate 2 and the other two fixing slot blocks 1 are fastened to the two opposite edges of the lower pole plate 3 of the TEM cell through the groove 11 .

[0081] Such as Figure 12 , Figure 13As shown, the carrying plate 5 is a hollow structure, which is located between the middle p...

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Abstract

For settling a technical problem that placement of an insulating cushion block affects a standard field environment in the TEM small chamber and further affects accuracy of a calibrating conversion coefficient, the invention provides a low-disturbance supporting structure for a TEM small chamber. The low-disturbance supporting structure can be used for open and traditional TEM small chambers. Theinvention provides the supporting structure in which a time domain electric field detector or a tested member is placed to an appropriate position in a standard field which is generated by the TEM small chamber. The low-disturbance supporting structure for the TEM small chamber mainly comprises the components of a fixed slot block which is fixed to a TEM small chamber intermediate pole plate or aTEM small chamber lower pole plate, a nylon screw which is used for fixing a wire pulling ring to the fixed slot block, and a bearing plate which is fixed through a pulling wire. The low-disturbance supporting structure has advantages of simple structure, easy realization and low cost. Determining of a pulling wire initial length can be realized through length designing of the fixed slot block, and simple operation is realized. The bearing plate is hollow and has adjustable height. The low-disturbance supporting structure has advantages of realizing small interference to the standard environment field of the TEM small chamber, improving testing precision and reducing uncertainty in detector calibration.

Description

technical field [0001] The invention belongs to the auxiliary device for calibrating the conversion coefficient of a time-domain electric field probe or the EMP effect test of a small electronic equipment system, and specifically relates to a low-disturbance support structure for a TEM cell, which is used to support an electric field detector or a small test object so that it is located TEM cell in place. Background technique [0002] Transverse electromagnetic (TEM) cells are widely used in nuclear electromagnetic pulse effect experiments. It can be used for the calibration of conversion coefficients of various time-domain electric field detectors and the high-altitude electromagnetic pulse (HEMP) effect test of small test objects. Among them, the calibration process of the conversion coefficient of the time-domain electric field probe is an important link to determine the quality of the test data. The commonly used method for conversion coefficient calibration is the sta...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R1/04
CPCG01R1/04G01R31/001
Inventor 杨静聂鑫陈伟石跃武朱志臻王伟
Owner NORTHWEST INST OF NUCLEAR TECH
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