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Space Radiation Reliability Evaluation Method for Aerospace Electronic Products

A technology of space radiation and electronic products, applied in electrical digital data processing, instruments, design optimization/simulation, etc., can solve problems such as the inability to clearly give space radiation reliability evaluation, damage, etc.

Active Publication Date: 2020-07-03
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problem that the existing technology cannot clearly give the reliability evaluation of space radiation as an electronic device, the purpose of the present invention is to provide a set of space radiation reliability evaluation methods for aerospace electronic products, specifically, from exploring the failure mechanism of the device Based on the space particle radiation simulation technology and Monte Carlo method, combined with the existing space radiation environment model, the reliability index of space radiation damage of aerospace electronic devices is obtained, in order to intuitively grasp the space radiation reliability level of products, Provide a reference for the design and optimization of products for the space radiation environment

Method used

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  • Space Radiation Reliability Evaluation Method for Aerospace Electronic Products
  • Space Radiation Reliability Evaluation Method for Aerospace Electronic Products
  • Space Radiation Reliability Evaluation Method for Aerospace Electronic Products

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specific Embodiment

[0074] Taking a certain type of aerospace electronic product as an example, the space radiation reliability evaluation method of the present invention is described in detail.

[0075] S1: Failure Physical Analysis

[0076] Selecting and establishing the fault-related information matrix of the applied space radiation environment effect is the first step in this method, and its completeness and accuracy directly determine the accuracy of the final simulation and evaluation results, so it is very critical.

[0077] First, obtain the main components and materials affected by space radiation in aerospace electronic products, including optical probe components, silicon photocells, logic devices, single / bistable devices, CMOS devices, power MOSFETs, surface cladding materials or coatings, satellite For internal dielectric materials, Table 3 lists the relationship between the main component types and the main radiation effects acting on them.

[0078] Table 3 Space radiation effect...

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Abstract

The invention discloses a space radiation reliability evaluation method for an aerospace electronic product. The method comprises the steps of making fault physical analysis; establishing a space radiation related fault information matrix, and classifying and collecting parameters of the physical model; carrying out single event effect simulation, total dose effect simulation and displacement damage effect simulation, considering the mutual relation between spatial fault mechanisms, analyzing the simulation life of the tested device under the single event effect, the total dose effect and thedisplacement damage effect, and acquiring the failure life of the tested device under the combined action of the spatial radiation environment effect. According to the invention, from the perspectiveof a fault mechanism; Aimed at the reliability development research related to the space radiation of the spaceflight electronic product, the invention provides a method for evaluating the space radiation reliability of the spaceflight electronic product based on simulation analysis, so that a designer can intuitively understand the space radiation reliability level of the product in the design stage, thereby providing a reference basis for the design improvement of the product.

Description

technical field [0001] The invention provides a simulation-based space radiation reliability evaluation method (Space Radiation Reliability, SRR) for evaluating aerospace electronic products, which belongs to the field of reliability analysis of aerospace electronic products. Background technique [0002] In recent years, a series of high-tech and complex equipment has been continuously launched in our country, major projects have continued to make breakthroughs, the construction of the space station is in order, and the plan to land on the moon is ready to go. Everything requires highly reliable electronic components. Due to the complex structure of the spacecraft, according to the reliability distribution theory, when the reliability of the system remains unchanged, the more components the system contains, the higher the reliability of a single component is. higher. The composition and structure of aerospace aircraft is complex. To ensure the normal operation of these lar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20
Inventor 陈颖马启超康锐
Owner BEIHANG UNIV
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