Wheat grain scab identification method based on imaging hyperspectral data
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- ANHUI UNIVERSITY
- Publication Date
- 2019-04-19
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Abstract
Description
technical field
[0001] The invention relates to the technical field of hyperspectral data processing, in particular to a method for identifying wheat grain head blight based on imaging hyperspectral data. Background technique
[0002] Fusarium scab is caused by Fusarium asiaticum and Fusarium graminearum and is a worldwide widespread crop disease. Wheat is the main food crop. The occurrence of scab will not only affect its yield Effective identification and detection of wheat scab and disease-infected wheat kernels have become the main content of current research in related fields.
[0003] At present, the detection methods of wheat scab mainly include biochemical methods such as thin-layer chromatography, high-performance liquid chromatography, gas chromatography, and enzyme-linked immunoassay. However, most of the above methods require a high professional background. At the same time, they are time-consuming, require a large amount of manpower and material resources, and ...