GIS equipment bad contact temperature rise simulation test platform

Abstract

The invention discloses a GIS equipment bad contact temperature rise simulation test platform. The existing GIS test platform cannot effectively perform regulation and simulation of a contact way dueto the single contact switching-on manner. The GIS equipment bad contact temperature rise simulation test platform comprises a strong current generator, a contact simulation and regulation module anda main circuit module, wherein the strong current generator is an alternating-current source, and is used for controlling and measuring current flowing through a conductor according to demands; the contact simulation and regulation module is constructed by arranging and connecting multiple types of switch blades in parallel, and is used for selecting the type of a simulation test contact and regulating the position of the contact; the main circuit module comprises a conductor; the conductor, the strong current generator and the contact simulation and regulation module are connected in series to form a test main circuit. By adopting the GIS equipment bad contact temperature rise simulation test platform, multitype and multi-position regulation for bad contact can be realized under the condition of not starting GIS equipment, and the in-situ current load of a GIS can be embodied in cooperation with the strong current generator in order to simulate temperature rise overheat failures generated by bad contact.

Description

technical field [0001] The invention relates to the technical field of high-voltage electrical equipment testing, in particular to a temperature-rise simulation test platform for poor contact of GIS equipment. Background technique [0002] Gas-insulated fully enclosed combined electrical equipment (GIS) is an important equipment that composes the power system. It has the characteristics of small size and easy maintenance, and has been widely used at present. Once the GIS equipment fails, it may cause a large-scale power system accident, resulting in huge personal and property losses. According to statistics, temperature rise and overheating caused by poor contact of GIS equipment contacts is one of the main causes of GIS equipment failures, accounting for about 30% of the total number of failures. [0003] In order to restore the cause of GIS equipment failure and study the failure mechanism, the GIS equipment test platform is usually used to simulate the real GIS and its f...

AI Technical Summary

Problems solved by technology

However, the existing test platforms are difficult to conveniently and accurately simulate the fault defect of poor contact of GIS contacts and cause temperature rise

On the one hand, the existing GIS test platform mostly adopts the test configuration of no-load voltage source, which cannot generate a large current to cause the temperature rise of the equipment; The contact closing method is single, and it is impossible to effectively adjust and simulate the contact method

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