Multimeter having probe storage and dedusting functions

A multimeter and test lead technology, applied in the field of multimeters, can solve problems such as scratches, test lead damage, increased test lead damage, etc., to achieve the effect of improving dust prevention, reducing the probability of damage, and improving safety.

Inactive Publication Date: 2019-05-03
刘晓慧
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing multimeters are exposed to the outside when the equipment is not idle, which can easily cause damage to the test leads and increase the probability of damage to the test leads, thus shortening the service life of the existing multimeter. Not only that, but the display screen of the existing multimeter is exposed for a long time. It is easy to be scratched by other items, and dust is easy to cover the display screen, which reduces the display clarity of the display screen, thereby reducing the practicability of the multimeter

Method used

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  • Multimeter having probe storage and dedusting functions
  • Multimeter having probe storage and dedusting functions
  • Multimeter having probe storage and dedusting functions

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Embodiment Construction

[0027] The present invention is described in further detail now in conjunction with accompanying drawing. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.

[0028] Such as figure 1 As shown, a multimeter with test lead storage and dust removal functions includes a main body 1, two test leads 2 and two cables 3, the test leads 2 correspond to the cables 3 one by one, and the test leads 2 are connected to the main body 1 through the cables 3 , the main body 1 is provided with a PLC, the main body 1 is provided with a display screen 4 and a plurality of control buttons 5, and the display screen 4 and the control buttons 5 are electrically connected to the PLC, and also includes a dust-proof mechanism and two storage Mechanism, the dust removal mechanism is set on the main body 1, and two storage mechanisms are respe...

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Abstract

The invention relates to a multimeter having probe storage and dedusting functions. The multimeter includes a main body, two probes, two cables, a dustproof mechanism and two storage mechanisms; the storage mechanisms include fixing boxes; the fixing boxes are provided with steady assemblies; each steady assembly includes a first motor, a drive gear, two racks and two reinforcing units; the reinforcing units include connection plates and reinforcing plates; the dustproof mechanism includes a cover plate and two movable assemblies; and movable boxes are provided with second motors, rotating shafts and slide blocks. Through the storage mechanisms, the probes can be stored into the fixing boxes when equipment is in idle, so that damage probability can be reduced, and the security of the multimeter can be enhanced; and through the dustproof mechanism, dustproof work can be performed on a display screen, so that dust can be prevented from covering the display screen to affect the display clarity of the display screen.

Description

technical field [0001] The invention relates to the field of testing equipment, in particular to a multimeter with the functions of pen storage and dust removal. Background technique [0002] Multimeters, also known as multimeters, multimeters, three-meters, multimeters, etc., are indispensable measuring instruments in power electronics and other departments. Generally, the main purpose is to measure voltage, current and resistance. Multimeters are divided into pointer multimeters and digital multimeters according to the display mode. It is a multi-functional and multi-range measuring instrument. Generally, the multimeter can measure DC current, DC voltage, AC current, AC voltage, resistance and audio level, etc., and some can also measure AC current, capacitance, inductance and semiconductor. Some parameters (such as β) and so on. [0003] Existing multimeters are exposed to the outside when the equipment is not idle, which can easily cause damage to the test leads and in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R15/12
Inventor 刘晓慧
Owner 刘晓慧
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