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An Analog Circuit Diagnosis Method Based on Multilevel Classification

A technology of analog circuits and diagnostic methods, applied in analog circuit testing, electronic circuit testing, etc., can solve the problems of low diagnostic accuracy and high complexity, and achieve the effect of accurate diagnosis range, reduction of complexity, and resolution of greater complexity.

Active Publication Date: 2020-11-06
GUILIN UNIV OF ELECTRONIC TECH
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Problems solved by technology

[0005] The present invention aims at the problems of low diagnosis accuracy and high complexity in the existing analog circuit fault diagnosis method, and provides an analog circuit diagnosis method based on multi-level classification

Method used

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  • An Analog Circuit Diagnosis Method Based on Multilevel Classification
  • An Analog Circuit Diagnosis Method Based on Multilevel Classification

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific examples and with reference to the accompanying drawings.

[0023] In order to quickly realize the effective classification of analog circuit faults, the present invention aims at different fault objects in the circuit, the characteristics of various faults are similar, and there are fuzzy boundaries between them, and a method based on principle analysis (PAS) and artificial intelligence algorithm is proposed Combined analog circuit diagnosis method, that is, an analog circuit diagnosis method based on multi-level classification, which is based on the idea of ​​multi-level classification, starting from the combination of frequency domain analysis and time domain analysis, firstly analyzes the principle of the test circuit, observes the The frequency spectrum characteristics of the tes...

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Abstract

The invention discloses an analog circuit diagnosis method based on multi-grade classification. Based on a multi-grade classification concept, by means of combination of frequency domain analysis andtime domain analysis, principle analysis is performed on a testing circuit; the frequency spectrum characteristic of a to-be-diagnosed circuit is observed; and primary positioning is performed on a fault according to changes of an upper-limit cut-off frequency and a lower-limit cut-off frequency. After primary positioning, a fault range is further reduced, afterwards, characteristics of a circuitfault signal are extracted through multi-resolution analysis for forming a fault characteristic set; and finally various faults are accurately identified by means of a support vector machine. The analog circuit diagnosis method can quickly and effectively realize accurate positioning of the analog circuit fault.

Description

technical field [0001] The invention relates to the technical field of analog circuit fault diagnosis, in particular to an analog circuit diagnosis method based on multi-level classification. Background technique [0002] With the development of science and technology, especially the rapid advancement of technology in the field of electronics and computers, there are more and more applications of electronic equipment, and the electronic components in the equipment are also becoming more and more complex and involving more and more aspects. However, each component plays a pivotal role in the entire equipment, and a small failure of any component may cause errors in the entire equipment, and even cause huge safety hazards. Not only to diagnose which components have changed in a timely manner, but also to accurately diagnose and locate the fault location and cause of the electronic components is the most important. [0003] Although a large part of the electronic equipment is ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/316
Inventor 马峻莫凡珣陈寿宏徐翠锋郭玲
Owner GUILIN UNIV OF ELECTRONIC TECH