Non-contact three-dimensional measuring system

A three-dimensional measurement and non-contact technology, applied in the field of three-dimensional measurement, can solve the problems that the three-dimensional measurement system cannot meet the measurement requirements and the three-dimensional measurement data is inaccurate, so as to improve the accuracy and solve the effect of inaccurate data

Inactive Publication Date: 2019-07-02
SUZHOU LINDIAN 3D TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] The purpose of the present invention is to provide a non-contact three-dimensional measurement system, which can not only solve the problem that the three-dimensional measurement system cannot meet different measurement requirements, but also solve the problem of inaccurate data in three-dimensional measurement

Method used

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Embodiment Construction

[0022] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0023] figure 1 is a schematic structural diagram of a non-contact three-dimensional measurement system provided by an embodiment of the present application, such as figure 1 As shown, the system includes at least:

[0024] n projection modules 110 irradiate striped light toward the object to be measured along the corresponding optical axis, and the incident angles of the optical axes of different projection modules relative to the measurement plane are different; n is an integer greater than or equal to 2; each projection module includes a light adjustment device 140. The light adjusting device 140 changes the phase of the fringes projected onto the object to be measure...

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Abstract

The invention relates to a non-contact three-dimensional measuring system which belongs to the technical field of three-dimensional measurement. The system comprises n projection modules which illuminate stripe rays toward an object to be measured along a corresponding optical axis. The incident angles of the optical axes of different projection modules are different from a measurement plane. n isan integer greater than or equal to 2. Each projection module comprises a light adjustment device which changes the phase of a stripe projected onto the object to be measured, an image capturing module which is used to photograph first images of the object to be measured reflected by different stripe rays and second images of the object to be measured reflected by stripe rays of different phases,and a control module which is used to measure the three-dimensional shape of the object to be measured according to a number of first images and calculate the error rate of three-dimensional measurement of the object to be measured according to a number of second images. The problems that a three-dimensional measuring system cannot meet different measurement requirements and three-dimensional measurement data are inaccurate are solved. The accuracy of three-dimensional measurement can be improved.

Description

technical field [0001] The invention relates to a non-contact three-dimensional measurement system, which belongs to the technical field of three-dimensional measurement. Background technique [0002] In recent years, due to the reduction in the size of components, many automated high-precision testing equipment have been developed to detect whether the appearance, line connection, and alignment relationship of electronic components are proper. The Multi-Frequency Method (Multi-Frequency Method) is a system used to test local plate bending on the substrate. It uses two different periods of fringes to project onto the object to be tested, and the fringes of different periods are respectively phase-shifted. After the phase is calculated, the two are further subtracted to calculate the phase of the wave envelope (Envelope). [0003] The reason for using multi-period fringes is that if a single-period fringe is used, when the size (such as height) of a specific direction of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G01B11/02
CPCG01B11/02G01B11/2513G01B11/254
Inventor 刘建立
Owner SUZHOU LINDIAN 3D TECH
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