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Radiation temperature measuring device

A technology for measuring device and radiation temperature, which is applied in the field of radiation temperature measuring device, and achieves the effect of preventing the reduction of measurement accuracy

Pending Publication Date: 2019-07-19
ASAHI KASEI KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In other words, the emissivity correction described above can only be used if the original light source reflected by the object is completely absent (zero)

Method used

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Embodiment Construction

[0033] Next, use Figure 1 to Figure 10 One embodiment of the present invention will be described.

[0034] (Structure of radiation temperature measuring device)

[0035] figure 1 It is a block diagram showing a schematic configuration example of the radiation temperature measurement device 100 according to this embodiment. The radiation temperature measurement device 100 is a device that measures the surface temperature of an object to be measured in a non-contact manner using an infrared sensor.

[0036] 1 is an infrared sensor. Regarding this infrared sensor, as will be described later, in the present invention, it is preferable to set the wavelength range to the mid-infrared wavelength range (4 μm to 8 μm) instead of the conventional far-infrared wavelength range (8 μm to 15 μm). .

[0037]The reflective polarizer 2 is a reflective polarizer. A reflective polarizer refers to a polarizer that functions to reflect one of electromagnetic waves. General polarizers have...

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Abstract

The objective of the present invention is to provide a radiation temperature measuring device with which it is possible to prevent a deterioration in temperature measurement accuracy attributable to electromagnetic waves reflected by a measured object. A radiation temperature measuring device (100) is provided with: a reflective-type polarizing plate (2) which reflects polarized light polarized inone direction, from among electromagnetic waves radiated from an object being measured, and transmits or absorbs polarized light polarized in a direction perpendicular to said one direction; and an infrared sensor (1) which detects the polarized light electromagnetic waves that have been polarized in said one direction and have been reflected by the reflective-type polarizing plate (2).

Description

technical field [0001] The present invention relates to a radiation temperature measuring device using an infrared sensor. Background technique [0002] Conventionally, there is known a temperature measuring device that uses an infrared sensor to measure the temperature of an object in a non-contact manner. Examples of its application products are radiation thermometers (non-contact thermometers) or thermal imagers (infrared cameras). Such a temperature measuring device uses the principle that the radiated electromagnetic wave energy of an object is determined only by the temperature of the object. That is, if an infrared sensor is used, it is possible to measure the radiant energy in the infrared wavelength range that accounts for most of the radiated electromagnetic wave energy of the object. The temperature of the object is calculated from the measured value of the radiant energy. To calculate the temperature of the object, for example, the Stefan-Boltzman law related ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/06G02B5/30
CPCG01J5/06G02B5/30G01J5/59G01J5/0808G01J5/10G02B5/3058G01J2005/604G01J5/48
Inventor 佐佐木裕之杉山大
Owner ASAHI KASEI KK