Smooth inner wall micro defect detection method based on stripe deflection
A technology for defect detection and stripes, applied in measuring devices, optical devices, image data processing, etc., can solve problems such as difficult detection, increased labor costs, inner wall scratches, etc., and achieve high-precision detection, simple structure, and easy replacement Effect
Active Publication Date: 2019-07-23
TIANJIN UNIV
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Problems solved by technology
Considering that in the mass production process, it is inevitable that the inner wall will be damaged and scratched. Therefore, before such parts are put into use, it is necessary to introduce a testing process to avoid affecting the final performance of the workpiece and causing irreparable losses.
But the problem is that, first of all, due to the shape limitation of this kind of parts, it is often difficult to directly detect
[0004](1) From the perspective of production process and cost, manual inspection will introduce unnecessary additional links to production assembly, which is not conducive to the realization of fully automatic production assembly. It will also increase labor costs
[0005](2) From the perspective of production efficiency, the speed of manual inspection is relatively slow, and online inspection cannot be realized
[0006](3) From the perspective of testing results, the reliability of manual testing cannot be guaranteed, and it is easy to introduce human error
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[0026] The present invention will be described below in conjunction with the accompanying drawings and examples.
[0027] Such as figure 1 As shown, the main structures required by the smooth inner wall defect detection method provided by the present invention are camera 1 and LCD screen 2, and whether there is a defect on the smooth inner wall of the tested object 3 can be detected by this method. Detection principle such as figure 2 As shown in the figure, the mirror surface 8 is used to represent a small area of the inner wall. When there is no defect in the mirror surface, the image formed by the stripes 6 in the mirror surface is shown in FIG. 7 . When there are surface defects 4 on the mirror surface, the fringe is affected by the defect 4, and the fringe mirror image is deflected 5. Therefore, by analyzing whether there is deflection in the mirror image, it can be indirectly judged whether there is a defect on the mirror surface. In the actual detection process, a ...
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The invention provides a smooth inner wall micro defect detection method based on stripe deflection, which is used for detecting a cylindrical detected piece without a cover and with a smooth inner wall, and comprises the following steps: placing a piece to be detected between an LCD screen and a camera, and using the LCD screen as a detection light source;enabling the LCD screen to display white,extracting an interested area, using a camera for collecting a smooth inner wall image at the moment, conducting binaryzation and connected domain processing sequentially on the collected image at the moment, obtaining an inner wall area serving as the interested area for facilitating follow-up processing. Defect identification is carried out in the region of interest.
Description
technical field [0001] The invention relates to a method for detecting tiny defects on a smooth inner wall. Background technique [0002] In industrial production applications, many parts have smooth or semi-smooth inner walls, such as inner walls of sleeves, inner walls of steel pipes, etc. With the continuous increase in the application requirements of such parts, it has entered the era of mass production and assembly. Considering that in the process of mass production, it is inevitable that the inner wall will be damaged and scratched. Therefore, before this type of parts are put into use, it is necessary to introduce a testing process to avoid affecting the final performance of the workpiece and causing irreparable losses. However, the existing problems are that, firstly, due to the shape limitation of such parts, it is often difficult to directly detect them. Secondly, such defects are often extremely small in scale, making it difficult to detect them through normal m...
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IPC IPC(8): G06T7/00G01B11/30
CPCG06T7/0004G01B11/30
Inventor 张效栋闫宁
Owner TIANJIN UNIV