Switching circuit board switching clamp framework and corresponding circuit switching method

Abstract

The invention provides a switching circuit board, a switching clamp framework and a corresponding circuit switching method. The switching clamp framework includes a rack, the switching circuit board,a testing assembly, a first needle bed board, a second needle bed board and a test clamp; two surfaces of the switching circuit board are correspondingly provided with a plurality of first joints anda plurality of second joints, and the first joints are electrically connected with the second joints; the testing assembly comprises a plurality of third joints, and the test clamp includes probes; the first needle bed board is arranged between the rack and the switching circuit board, and comprises a plurality of first electrical connection parts which are used for electrically connecting the first joints and the third joints; and the second needle bed board is arranged at the top of the switching circuit board, and includes a plurality of second electrical connection parts which are used forelectrically connecting the second joints and the probes. According to the switching clamp framework, the switching circuit board is mounted between the first needle bed board and the second needle bed board, so the testing assembly can test various circuit boards waiting to be tested with different specifications.

Description

technical field [0001] The invention relates to the field of circuit board testing equipment, in particular to a transfer circuit board, a transfer fixture structure and a corresponding circuit transfer method. Background technique [0002] After the circuit board is manufactured, it is generally necessary to conduct an electrical test for the qualification of the detector. In the existing technology, there are general testing machines, special testing machines, flying probe testing machines, etc. to test the electrical performance of circuit boards. At present, the testing area of ​​general testing machines can only reach 488mm*650mm. Test; the test points of the special test machine are generally only more than 10,000 points, while the test points of the large-sized circuit board generally have more than 60,000 points, so the special test machine cannot meet the test requirements of the large circuit board; the flying probe test machine Although it can meet the requiremen...

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a transition fixture structure, which allows the test assembly to test a variety of different specifications of the circuit boards to be tested by setting a transition circuit board between the first needle bed board and the second needle bed board, and can test more than general testing The circuit board to be tested with a larger test area can solve the problem of limited test range or low test efficiency of the general test machine, special test machine and flying probe test machine in the prior art

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