Transfer circuit board, transfer fixture structure and corresponding circuit transfer method

Abstract

The invention provides a transfer circuit board, a transfer fixture structure and a corresponding circuit transfer method. The transfer fixture structure includes a frame, a transfer circuit board, a test component, a first needle bed board, a second needle bed board and a test fixture A plurality of first connection points and second connection points are respectively arranged on both sides of the transfer circuit board, the first connection points are electrically connected to the second connection points, the test assembly includes a plurality of third connection points, and the test fixture includes For the probe, the first needle bed board is arranged between the frame and the transfer circuit board, including a plurality of first electrical connectors for electrically connecting the first connection point and the third connection point, and the second needle bed board is arranged on The top of the transfer circuit board includes a plurality of second electrical connectors for electrically connecting the second connection points and the probes. The transition fixture structure of the present invention provides a transition circuit board between the first bed of needles board and the second bed of needles board, so that the test assembly can test a variety of circuit boards to be tested with different specifications.

Description

technical field [0001] The invention relates to the field of circuit board testing equipment, in particular to a transfer circuit board, a transfer fixture structure and a corresponding circuit transfer method. Background technique [0002] After the circuit board is manufactured, it is generally necessary to conduct an electrical test for the qualification of the detector. In the existing technology, there are general testing machines, special testing machines, flying probe testing machines, etc. to test the electrical performance of circuit boards. At present, the testing area of ​​general testing machines can only reach 488mm*650mm. Test; the test points of the special test machine are generally only more than 10,000 points, while the test points of the large-sized circuit board generally have more than 60,000 points, so the special test machine cannot meet the test requirements of the large circuit board; the flying probe test machine Although it can meet the requiremen...

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a transition fixture structure, which allows the test assembly to test a variety of different specifications of the circuit boards to be tested by setting a transition circuit board between the first needle bed board and the second needle bed board, and can test more than general testing The circuit board to be tested with a larger test area can solve the problem of limited test range or low test efficiency of the general test machine, special test machine and flying probe test machine in the prior art

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