A multifunctional diode testing device and its operating method
A technology of a test device and an operation method, which is applied in the direction of measurement device, single semiconductor device test, measurement of electricity, etc., can solve the problems of leg cutting without diodes, inaccurate test results, and few diodes, etc., to achieve good stability, improve Test efficiency, the effect of functional diversification
Active Publication Date: 2021-07-13
ANHUI MINGYANG ELECTRONICS
View PDF5 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] There are certain drawbacks in the use of the existing diode testing device. The existing diode testing device has a single function, only has the testing function, and does not have other functions such as cutting the legs of the diode, and the existing diode testing device is testing The number of diodes that can be tested at one time is small, and multiple diodes cannot be tested at one time. In addition, the existing diode test device does not have the function of heat preservation, which may interfere with the test results of the diodes due to the influence of temperature, resulting in Inaccurate, which has a certain impact on actual use
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0033] Such as Figure 1-7 As shown, a multifunctional diode testing device includes a test bench 1, two sets of limit grooves 2 are provided on the top of the test bench 1, and the top of the test bench 1 is embedded between the two sets of limit grooves 2. Test panel 3, the top of test panel 3 is provided with positioning plate 4, and the top of test stand 1 is provided with cutting disk 5 by the side wall of test panel 3, and the rear end of test stand 1 is equipped with suppor...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a multifunctional diode testing device, which comprises a test bench, two sets of limit slots are opened on the top of the test bench, and the top of the test bench is embedded between the two sets of limit slots. A test panel, the top of the test panel is provided with a positioning plate, the top of the test bench is provided with a cutting disk against the side wall of the test panel, the rear end of the test bench is equipped with a support plate, and the front end of the support plate A connecting plate is installed on the top; a multifunctional diode testing device of the present invention can better fix and position the diode by setting a positioning plate and opening a plurality of positioning grooves on the positioning plate, and cooperate with the test panel to realize multiple The diodes are tested at the same time to improve the test efficiency. By setting the cutting disk, the diode legs can be cut. By setting the incubator, the storage of the diodes can be facilitated and the temperature can be heated, effectively avoiding the interference of the temperature on the diode test.
Description
technical field [0001] The invention belongs to the technical field of diode testing, and in particular relates to a diode testing device, more specifically a multifunctional diode testing device and an operation method thereof. Background technique [0002] In the production of diodes, the finished diodes need to be tested to confirm whether the diodes can be energized normally. Therefore, it is necessary to use a test device to test the diodes. When the diodes are powered on, it means that the diodes are energized normally. Otherwise, it indicates that the diodes are in poor contact. , in this way to judge whether the diode is energized normally. [0003] There are certain drawbacks in the use of the existing diode testing device. The existing diode testing device has a single function, only has the testing function, and does not have other functions such as cutting the legs of the diode, and the existing diode testing device is testing The number of diodes that can be te...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 陈敏顾亚英邓肖肖
Owner ANHUI MINGYANG ELECTRONICS