Fizeau interferometer hysteresis error elimination method
A Fizeau interferometer and backhaul error technology, applied in the field of interferometry, can solve the problems of different carrier fringe densities, insufficient quantification, failure to use default settings, etc., and achieve the effect of high precision and strong versatility
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the embodiments do not limit the protection scope of the present invention.
[0035] figure 1 It is a structural schematic diagram of an embodiment of a Fizeau interferometer system applied to the interferometer backhaul error elimination method of the present invention,
[0036] The applied system of the interferometer backhaul error elimination method of the present invention comprises a Fizeau interferometer 1, a reference mirror 2, a measured mirror 3, a reference mirror adjustment frame 4, and a measured mirror adjustment frame 5; the reference mirror 2 is installed on the reference On the mirror adjustment frame 4, the measured mirror 3 is installed on the measured mirror adjustment frame 5; the outgoing light of the Fizeau interferometer 1 is incident on the surface of the measured mirror 3 after passing through the reference mirror 2, and pass...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



