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Support device used for X-ray instrument and flaw detection method

A support device and ray technology, which is applied to measuring devices, machines/supports, material analysis using wave/particle radiation, etc. Time-consuming and labor-intensive problems, to achieve the effect of high work efficiency and rapid transformation and adjustment

Pending Publication Date: 2019-11-05
SHENHUA FUJIAN ENERGY COMPANY +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention discloses a bracket device for a radiograph and a flaw detection method to solve the problem that the current fixed placement mechanism is inconvenient to change and adjust the transmission focal length and incident angle of the radiometer because it is built at a fixed position, and to solve the problem of flaw detection. The problem of time-consuming and labor-intensive work and low work efficiency

Method used

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  • Support device used for X-ray instrument and flaw detection method
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  • Support device used for X-ray instrument and flaw detection method

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Embodiment Construction

[0038] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with specific embodiments of the present invention and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0039] The technical solutions disclosed by various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0040] Please refer to Figure 1-Figure 5 As shown, the embodiment of the present invention discloses a support device for a ray flaw detector. The disclosed support device includes a clamping me...

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PUM

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Abstract

The invention discloses a support device used for an X-ray instrument and a flaw detection method. The disclosed support device comprises a clamping mechanism, an advance and retreat adjusting mechanism and an angle adjusting mechanism. The angle adjusting mechanism comprises a first fixing plate, a first rotating plate, a second fixing plate and a second rotating plate, wherein the first fixing plate and the second fixing plate face each other and are arranged at advance and retreat execution ends of the advance and retreat adjusting mechanism, the first rotating plate is rotationally connected with the first fixing plate through a first rotary shaft, and the second rotating plate is rotationally connected with the second fixing plate through a second rotary plate; the two side surfaces,facing each other, of the first rotating plate and the second rotating plate are both X-ray instrument fixing surfaces; and the second fixing plate is provided with a driving rotary shaft, and the driving rotary shaft is in transmission connection with the second rotary shaft through a transmission mechanism. By means of the scheme, the problems that currently, a fixed placing mechanism is erectedin a fixed position, the transmission focal length and the incident angle of the X-ray instrument are inconvenient to change or adjust, flaw detection operation consumes time and labor, and the working efficiency is low are solved.

Description

technical field [0001] The present invention relates to the technical field of radiographic flaw detection technology, in particular to a support device for a radiographic instrument and a flaw detection method. Background technique [0002] With the development of science and technology, radiographic flaw detection has been widely used in the non-destructive testing of pipeline component welds; among them, radiographic testing generally includes X-ray testing and Y-radiation source ray testing; while for single pipe weld flaw detection In inspection, because X-ray inspection has the advantages of high detection sensitivity and easy identification of subtle defects compared with Y-ray inspection, X-ray inspection is generally used for weld flaw detection of single pipe. [0003] At present, in the X-ray inspection process of a single pipe, it is necessary to set up a fixed installation mechanism such as a special platform and a bracket, so as to place and fix the X-ray instr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): F16M13/02F16M11/04G01N23/00
CPCF16M13/02F16M11/04G01N23/00
Inventor 刘鸿国
Owner SHENHUA FUJIAN ENERGY COMPANY
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