Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A non-linear s-parameter testing device

A verification device, non-linear technology, used in the field of radio metrology and testing

Active Publication Date: 2021-07-13
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] This application proposes a nonlinear S parameter testing device to solve the problem of calibration and testing of nonlinear network analyzers

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A non-linear s-parameter testing device
  • A non-linear s-parameter testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0025] The existing technology can realize the verification of the S parameter index of the linear network analyzer. Usually, the reflection amplitude standard, transmission amplitude standard and transmission phase standard are used to realize the calibration and verification of the reflection amplitude, transmission amplitude and transmission phase ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The application discloses a nonlinear S parameter testing device, which includes an amplification and amplitude stabilization circuit and a nonlinear transmission line. The microwave signal is output through the amplifying and stabilizing circuit, and then through the nonlinear transmission line; the amplifying and stabilizing circuit has a stable value of sine wave output amplitude of 22dBm, and the variation is less than 0.05dB / 10°C; the nonlinear transmission line is a microwave transmission line A monolithic microwave integrated circuit that generates nonlinear propagation characteristics through dispersive operating conditions. This application solves the problem of calibration and verification of nonlinear network analyzers.

Description

technical field [0001] The present application relates to the field of radio measurement and testing, in particular to a non-linear S-parameter inspection device. Background technique [0002] RF microwave systems are usually composed of active devices and passive devices, and active devices often have nonlinear characteristics, that is, new frequency components are generated. The research and design of such high-performance RF active devices poses a challenge to designers. The key issue is how to characterize the nonlinear characteristics of the device, so as to reduce the adverse effects of the nonlinearity of the device, or make use of it. Provides a linear, high-efficiency high-power solution. Amplifier is an indispensable component in the field of wireless communication. Due to its nonlinear characteristics, spectrum is often wasted; if the power amplifier is designed to work only in its linear region in order to consider the efficiency of spectrum utilization, it will...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 陈婷任士卿姜河程春悦
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com