A novel millimeter-wave radar chip mass production testing method and device
A millimeter wave radar and test method technology, applied in the field of communication, can solve the problems of high test cost, long development cycle, and no support for high frequency bands, and achieve the effect of reducing test cost, strong practicability, and shortening development cycle
Active Publication Date: 2021-01-01
矽杰微电子(厦门)有限公司
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Problems solved by technology
[0003] However, the ATE (Automatic Test Equipment, integrated circuit automatic testing machine) used for chip mass production testing does not support high-frequency bands. The existing millimeter-wave radar chip mass production testing methods are usually implemented by using external high-frequency test instruments combined with ATE. High-frequency test instruments, which will cause technical problems such as high test cost and long development cycle
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[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present invention.
[0029] It should be noted that the embodiments of the present invention and the features of the embodiments may be combined with each other under the condition of no conflict.
[0030] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, but it is not intended to limit the present invention.
[0031] The present invention provides a novel mass production testing method for ...
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The invention relates to the technical field of communications, and in particular to a novel mass production test method and device for a millimeter wave radar chip. The mass production test method for the millimeter wave radar chip comprises the following steps of step S1, providing a tested chip; step S2, enabling a transmitting terminal of the tested chip 1 to transmit a first radio frequency signal and enabling a receiving terminal of the tested chip to receive the first radio frequency signal; step S3, providing an alternating current and direct current conversion device so that the firstradio frequency signal is converted into a direct current signal; and step S4, providing an automatic integrated circuit test device to test the direct current signal, and testing the first radio frequency signal received by the receiving terminal of the tested chip. The novel mass production test method and device for the millimeter wave radar chip have the beneficial effects that, in the mass production test process of the millimeter wave radar chip, the chip receives the signal transmitted by itself for testing and is tested by using the automatic integrated circuit test device after the alternating current is converted to the direct current, thereby simplifying the test program and reducing the development cycle; meanwhile the test cost is reduced because an high-frequency instrumentis not needed and the practicability is high.
Description
technical field [0001] The present invention relates to the field of communication technology, and in particular, to a novel millimeter wave radar chip mass production testing method and device. Background technique [0002] Millimeter-wave radar has extremely wide information bandwidth, unique radio wave propagation characteristics and good potential for small devices. It is used in smart home and Internet of Things systems, enriching the functions of smart home systems and Internet of Things. In the mass production test of radar chips , The operating frequency of millimeter-wave radar chips is high, so the requirements for test equipment are also high. [0003] However, the ATE (Automatic Test Equipment) used for chip mass production testing does not support high-frequency bands. The existing millimeter-wave radar chip mass production test method is usually realized by using external high-frequency test instruments combined with ATE. High-frequency test instruments will c...
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IPC IPC(8): G01S7/40G01R31/28
CPCG01R31/2822G01S7/4004
Inventor 李思成卢煜旻朱欣恩曹建黄勇
Owner 矽杰微电子(厦门)有限公司