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Method and system for reconstructing super-resolution image of atomic force microscope

An atomic force microscope and low-resolution image technology, applied in image data processing, graphics and image conversion, complex mathematical operations, etc., can solve problems such as complex and expensive hardware costs, achieve short imaging time, reduce the number of interactions, and measure high efficiency effect

Active Publication Date: 2019-11-22
FUZHOU UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, complex hardware design and modification of standard AFM will bring expensive hardware cost

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  • Method and system for reconstructing super-resolution image of atomic force microscope
  • Method and system for reconstructing super-resolution image of atomic force microscope
  • Method and system for reconstructing super-resolution image of atomic force microscope

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[0029] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0030] It should be pointed out that the following detailed description is exemplary and is intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0031] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combina...

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Abstract

The invention relates to a method and system for reconstructing a super-resolution image of an atomic force microscope. The method includes: mapping the low-resolution atomic force microscope image Lto a blank template required for reconstructing a high-resolution atomic force microscope image; and obtaining an intermediate high-resolution image X, constructing a corresponding special measurementmatrix according to pixel position information of the intermediate high-resolution image, and finally reconstructing a high-resolution atomic force microscope image by using a reconstruction algorithm. The method system have the advantages of short integral imaging time, high measurement efficiency and the like, and can reduce the abrasion of the probe tip and reduce the surface damage of the sample.

Description

technical field [0001] The invention relates to the technical field of super-resolution image reconstruction, in particular to a method and system for super-resolution image reconstruction of an atomic force microscope. Background technique [0002] AFM is a powerful tool for exploring nanoscale features, and it can observe nanoscale objects in air and liquid environments. This unique capability enables the AFM to be used as a nanotool for various measurements in physiological solution environments. Standard AFMs take a long time to obtain accurate images due to the Nyquist-Shannon sampling theorem used to acquire AFM images. In addition, the force exerted by the probe tip on the sample surface can cause damage to the sample, especially soft surface samples such as biological cells. In the case of ensuring the imaging quality, it is very important to increase the measurement speed and reduce the interaction between the tip and the sample. At present, there are mainly two ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T3/40G06F17/11G06F17/16
CPCG06F17/11G06F17/16G06T3/4053
Inventor 韩国强吕路遥许海山牛弋翔邹宇杨高鹏
Owner FUZHOU UNIV