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System and method for rapid calibration of comprehensive tester in generation stage

A technology in the generation stage of a comprehensive tester, applied in the field of rapid calibration system in the generation stage of a comprehensive tester, can solve the problems of low efficiency of frequency point calibration, achieve the effect of reducing the number of interactions and optimizing the test process

Active Publication Date: 2021-10-22
DATANG LINKTESTER TECH
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Problems solved by technology

[0004] The invention provides a rapid calibration system and method in the generation stage of a comprehensive tester, which is used to solve the problem of low efficiency of the frequency point calibration of the comprehensive tester in the prior art

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  • System and method for rapid calibration of comprehensive tester in generation stage
  • System and method for rapid calibration of comprehensive tester in generation stage

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Embodiment Construction

[0032] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0033] figure 1 It shows that an embodiment of the present invention provides a rapid calibration system for the generation stage of an integrated tester, including a processing device 11, an integrated tester 12, and a radio frequency instrument 13, wherein:

[0034] The processing device is configured to configure a first test information sequence table and a second test information sequence table, and send the first test information sequence table to the comprehensive tester, and send the second test information sequence table to the radio frequency instrument;

[0035] The comprehensive tester is configured to sequentially send power signals to the radio frequency in...

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Abstract

The present invention provides a rapid calibration system and method in the generation stage of a comprehensive tester. The system includes: a processing device configured to configure a first test information sequence table and a second test information sequence table, and send the first test information sequence table to For the integrated tester, send the second test information sequence list to the radio frequency instrument; the integrated tester is used to sequentially send power signals to the radio frequency instrument according to the first test information sequence list; the radio frequency An instrument, configured to sequentially analyze the power signal according to the second test information sequence list to obtain a test power value, and send the measured power value to the processing device; the processing device is also configured to obtain a test power value according to the Gain compensation values ​​are obtained by measuring the power value and the corresponding calibration power value to achieve automatic testing, optimize the testing process, reduce the number of interactions between instruments, improve the production efficiency of the comprehensive tester and reduce production costs.

Description

technical field [0001] The invention relates to the technical field of comprehensive tester generation, in particular to a rapid calibration system and method for the comprehensive tester generation stage. Background technique [0002] At present, the comprehensive tester needs to calibrate the RF devices of the whole machine during the production process. The calibration accuracy will affect the subsequent use. In order to ensure the accuracy of the instrument in the whole frequency band, it is often necessary to reduce the calibration frequency point density. The way to calibrate as many frequency points as possible. Among them, the negative impact will be the reduction of calibration efficiency. This problem has seriously affected the output of the instrument. The conflict between accuracy and efficiency is a common problem faced by all instrument manufacturers in the industry. [0003] In order to improve production efficiency, the factory can only solve the problem by ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R3/00G01R35/00
CPCG01R3/00G01R35/005
Inventor 杨超
Owner DATANG LINKTESTER TECH
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