Device and method for testing turning diameter of superconducting strip

A technology of superconducting strip and turning diameter, applied in electromagnetic measuring device, superconducting performance measurement, electric/magnetic diameter measurement, etc., can solve the problem that the critical current cannot deduce the critical turning diameter of the strip, etc.

Active Publication Date: 2020-01-17
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this case, the critical current obtained by the transmission method after weighted ave

Method used

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  • Device and method for testing turning diameter of superconducting strip
  • Device and method for testing turning diameter of superconducting strip
  • Device and method for testing turning diameter of superconducting strip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] Such as figure 1 with figure 2 As shown, the device for testing the turning diameter of a superconducting strip provided in this embodiment includes: a strip discharge end 3, a strip receiving end 2 and a turning diameter test board 10. A plurality of bending diameter test blocks 4 and a plurality of guide blocks 5 are provided on the turning diameter test board 10. Each bending diameter test block 4 has a different bending diameter. The bending diameter test blocks 4 are arranged in a row from small to large according to their respective bending diameters. Each bending diameter test block 4 corresponds to two guide blocks 5. The two guide blocks 5 are located on the left and right sides below the corresponding bending diameter test block 4.

[0045] Specifically, the overall surface roughness of the bending diameter test block 4 is less than Ra1.6, and the top has an arc surface, and the corresponding bending diameter is provided by the arc surface of itself, so that the...

Embodiment 2

[0048] Such as image 3 with Figure 4 As shown, the device for testing the turning diameter of a superconducting strip provided in this embodiment includes: a strip discharge end 3, a strip receiving end 2 and a turning diameter test board 10. A plurality of bending diameter test wheels 6 and a plurality of guide wheels 7 are provided on the turning diameter test board 10. Each bending diameter test wheel 6 has a different bending diameter. The bending diameter test wheels 6 are arranged in a row from small to large according to their respective bending diameters. Each bending diameter test wheel 6 corresponds to two guide wheels 7. The two guide wheels 7 are located at the left and right sides below the corresponding bending diameter test wheel 6.

[0049] Specifically, the overall surface roughness of the curved diameter test wheel 6 is less than Ra1.6, and the corresponding curved diameter is provided by the curved surface of itself to bend the superconducting strip 1 to be t...

Embodiment 3

[0052] Such as Figure 5 with Image 6 As shown, the device for testing the turning diameter of a superconducting strip provided in this embodiment includes: a strip discharge end 3, a strip receiving end 2 and a turning diameter test board 10. A plurality of bending diameter test wheels 8 are provided on the turning diameter test board 10.

[0053] Every two bending diameter test wheels 8 form a group, and different groups of bending diameter test wheels 8 have different bending diameters. In this embodiment, two bending diameter test wheels 8 with the same bending diameter are placed on the left and right, so that multiple sets of bending diameter test wheels 8 are arranged in two rows according to the bending diameter from small to large. Among them, the left and right rows can be placed up and down to avoid friction damage to the superconducting strip 1 to be tested.

[0054] Specifically, the overall surface roughness of the bending diameter test wheel 8 is less than Ra1.6, s...

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PUM

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Abstract

The invention provides a device and a method for testing the turning diameter of a superconducting strip. The device comprises: a strip discharging end capable of placing a superconducting strip to betested; a strip receiving end connected with one end of the superconducting strip to be tested and capable of recycling the superconducting strip to be tested from the strip discharging end; and a turning diameter test board, comprising a bending diameter test piece of a variety of bending diameters and capable of bypassing the superconducting strip to be tested to bend the superconducting stripto be tested according to the corresponding being diameter. The device provided by the invention can be used for quickly testing the critical turning diameter value of the superconducting strip through the bending diameter test piece of a variety of bending diameters, and can quickly, effectively and accurately measure the single-bending and double-bending critical turning diameter values of the high-temperature superconducting strip by combining the twice tests via a magnetic survey method.

Description

Technical field [0001] The invention relates to the field of superconducting material testing devices, in particular to a testing device and method for the turning diameter of superconducting strips. Background technique [0002] In some large scientific devices, superconducting coils are required to generate extremely high magnetic fields, and the size of the coils is very large, such as Tokmak’s D-coil. To wind such a coil, in order to reduce the inductance, the cable needs high critical current and high current-carrying density under the same number of ampere turns. At the same time, it has good mechanical properties and deformation requirements such as bending in the magnet manufacturing process. [0003] The patent document CN 103493152A "Superconducting cable and its manufacturing method" introduces the structure of CORC (Conductor On Round Core) cable in detail. Superconducting cables use one or more superconducting tapes wound around a skeleton. The compact superconducti...

Claims

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Application Information

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IPC IPC(8): G01R33/12G01B7/12
CPCG01B7/12G01R33/1246
Inventor 朱佳敏陈思侃甄水亮盛杰李柱永黄振赵跃储静远
Owner SHANGHAI JIAO TONG UNIV
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