Supercharge Your Innovation With Domain-Expert AI Agents!

A fault diagnosis analysis method and device

A technology of fault diagnosis and analysis method, applied in the direction of program control, instrument, test/monitoring control system, etc., can solve the problem of increasing difficulty of fault diagnosis and analysis, and achieve the effect of reducing the workload of maintenance and analysis and improving efficiency.

Active Publication Date: 2021-03-16
宁波地铁产业工程有限公司
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, with the continuous expansion of the scale and complexity of modern industrial processes, there are complex relationships among the various parts of the system in operation, such as power supply subsystems, computer network subsystems, and various professional management subsystems. The probability of multiple subsystems failing at the same time is high, which makes fault diagnosis and analysis increasingly difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A fault diagnosis analysis method and device
  • A fault diagnosis analysis method and device
  • A fault diagnosis analysis method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The application describes a number of embodiments, but the description is illustrative rather than restrictive, and it will be obvious to those of ordinary skill in the art that within the scope of the embodiments described in the application, There are many more embodiments and implementations. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are possible. Except where expressly limited, any feature or element of any embodiment may be used in combination with, or substituted for, any other feature or element of any other embodiment.

[0040] This application includes and contemplates combinations of features and elements known to those of ordinary skill in the art. The disclosed embodiments, features and elements of this application can also be combined with any conventional features or elements to form unique inventive solutions as defined by the clai...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fault diagnosis and analysis method and apparatus. The method comprises the steps of creating a comprehensive object instance comprising several associated alarm sub-objects;receiving, by the comprehensive object instance, fault alarm information, determining a corresponding alarm device and a fault phenomenon, and searching for all failure causes causing the fault phenomenon and fault phenomena of the associated device caused by the failure causes; creating a virtual comprehensive object instance containing each possible cause of the alarm of each alarm sub-object and the associated failure phenomenon; and performing weighted voting and linear regression analysis on the virtual comprehensive object instance, and determining the failure cause based on the resultsof weighted voting and analysis. According to the fault diagnosis and analysis method and apparatus disclosed by the invention, by creating the comprehensive object instance, receiving the fault alarm information by the comprehensive object instance, creating the virtual comprehensive object instance, and performing the weighted voting on the virtual comprehensive object instance, the fault source is positioned quickly and accurately, real-time diagnosis of device faults is realized, and the maintenance analysis workload of device management personnel is relieved.

Description

technical field [0001] The embodiments of the present application relate to but are not limited to the technical field of fault detection, and in particular, relate to a fault diagnosis and analysis method and device. Background technique [0002] In process control or process monitoring, production and operation management enterprises often need to grasp and analyze the status of control objects or monitoring objects in real time due to specific functional requirements. As an important part of process control or process monitoring, fault diagnosis analysis has achieved great development. Fault diagnosis analysis has two meanings: on the one hand, fault location, that is, through the pre-set system structure and algorithm to diagnose the environmental status of equipment faults, and determine the precise alarm location of the equipment in the same environment; on the other hand, fault analysis, The analysis content generally includes the fault mechanism, fault mode and impa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02
CPCG05B23/0262G05B2219/24065
Inventor 陈斌杨树松陆建军朵建华俞益
Owner 宁波地铁产业工程有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More