Testing integrated machine for luminescent device
A light-emitting device and an all-in-one technology, which is applied in optical instrument testing, machine/structural component testing, optical performance testing, etc., and can solve the time-consuming and labor-intensive testing of light-emitting components.
Active Publication Date: 2020-02-04
SHENZHEN SIDEA SEMICON EQUIP
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Problems solved by technology
[0004] In view of the deficiencies of the above-mentioned prior art, the purpose of the present invention is to provide a light-emitting device testing all-in-one machine, which solves the problem of time-consuming and labor-intensive testing of the light parameters of the tested light-emitting device
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[0027] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0028] A light-emitting device testing all-in-one machine, such as figure 1 As shown, it includes a machine base 1, the machine base 1 includes a first table top and a second table top spaced apart from the first table top, the area of the first table top is larger than the area of the second table top, and the first table top is located directly below the second table top . Among them, the second table has a relief gap 9 that runs through its upper and lower surfaces, and the relief gap 9 is in a circular shape; the second table is located at the relief gap 9 and is equipped with four test needles 7 and blowing parts 11, and the four test The needle 7 is bent downward and moves closer at the center of the gap 9, and the air outlet of the blower 11 faces the needle point of the test needle 7; a slide table 6 is installed between the first table and the s...
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The invention discloses a testing integrated machine for a luminescent device. The testing integrated machine comprises a machine base and a mounting seat; the mounting seat is sequentially provided with a near-field testing assembly used for examining waist radii of luminescent pieces, a far-field testing assembly used for testing divergence angles of the luminescent pieces, and an integrating sphere used for testing the wavelength brightness of the luminescent pieces; and the machine base is provided with a piece bearing table used for bearing the luminescent pieces, a testing needle used for making contact with electrodes of the luminescent pieces, and a first driving mechanism used for driving the mounting seat to move in the length direction of the mounting seat, after the luminescentpieces are mounted on the piece bearing table, the electrodes of the luminescent pieces make contact with the testing needle, the first driving mechanism drives the mounting seat to move on the machine base in the length direction of the mounting seat, and thus the near-field testing assembly, the far-field testing assembly and the integrating sphere directly face the luminescent pieces on the piece bearing table correspondingly for testing so as to test various optical parameters of the luminescent pieces. According to the testing types of the optical parameters of the needed luminescent pieces, the different testing assemblies are sequentially mounted on the mounting seat, and the time and labor are saved.
Description
technical field [0001] The invention relates to the technical field of light-emitting device detection, and more specifically, to an all-in-one machine for testing light-emitting devices. Background technique [0002] In the existing test system for light-emitting parts, the light-emitting part is lighted up after the corresponding current is applied by contacting the corresponding electrode of the light-emitting part with the test needle, and its optical parameters are tested. The test of light parameters includes several key parameters, such as optical power Wavelength, far-field divergence angle, near-field spot condition, near-field beam waist radius, etc. [0003] The slide table in the luminous component testing system is used to carry the luminous component under test, and the optical parameter testing device is used to collect the optical parameters of the light-emitting surface when the luminous component under test is turned on. The optical parameters of the lumino...
Claims
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Login to View More IPC IPC(8): G01M11/02
CPCG01M11/00
Inventor 刘振辉王业文颜华江杨波
Owner SHENZHEN SIDEA SEMICON EQUIP