Method for improving accurate focal length of exposure machine

An exposure machine and focal length technology, applied in the field of exposure machines, can solve the problems affecting the accuracy of exposure machines, the focal length cannot meet production requirements, and the yield rate is reduced, and achieves the effects of improving autofocus capability, transferring high-quality graphics, and reducing costs.

Inactive Publication Date: 2020-02-07
江苏上达半导体有限公司
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  • Summary
  • Abstract
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AI Technical Summary

Problems solved by technology

[0005] ①With the finer and denser lines, the mark pattern of the existing exposure machine cannot make the exposure machine focus accurately and efficiently, and the focal length cannot meet the production requirements, which seriously affects the accuracy of the exposure machine
[0006] ②The lines become thinner and denser. After the exposure of the existing technology, exposure deviation will occur, which will increase the tolerance of the product.
[0007] ③If serious exposure deviation occurs, the product will exceed the production specification and become a defective product, thereby reducing the yield rate

Method used

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  • Method for improving accurate focal length of exposure machine
  • Method for improving accurate focal length of exposure machine
  • Method for improving accurate focal length of exposure machine

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Embodiment Construction

[0033] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts fall within the protection scope of the present invention.

[0034] A method for improving the precise focal length of an exposure machine, the method is: on the glass negative film, this figure is set as the mark figure of the exposure machine, during exposure, the light of the exposure machine will project the mark figure onto the alignment shape on the product, Alignment is accomplished by coincidence of the center of the projection of the marking graphic and the center of the alignment shape on the product; among ...

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Abstract

The invention discloses a method for improving the accurate focal length of an exposure machine. The method comprises the following steps of: setting a figure into a mark figure of an exposure machineon a glass negative film, projecting the mark figure onto an alignment shape on a product by light of the exposure machine during exposure, and completing alignment by overlapping a mark figure projection center and an alignment shape center on the product. The design of a plurality of corners and the design of a plurality of parallel line segments are adopted in the graph, so that the center ofthe graph can be quickly and accurately grabbed; the number of the parallel line segments can be designed according to the size of the alignment shape on the product, so that the center of the line segment in the middle of the number of the parallel line segments of the precise focal length graph corresponds to the center of the alignment shape on the product, and the center of the focal length graph and the center of the alignment shape of the product can be quickly and accurately overlapped. By adopting the focal length graph, the situation that the alignment precision is reduced due to incomplete graphs caused by etching of the glass negative film graph can be avoided.

Description

technical field [0001] The invention relates to the field of exposure machines, in particular to a method for improving the precise focal length of an exposure machine. Background technique [0002] With the development of social economy, the electronics industry has also entered a stage of rapid development, and people's requirements for electronic products tend to be small, thin, and functional. Therefore, the product design stage needs to arrange finer and denser circuits. The thinner and denser product lines created a big problem for production. The original lines are thick and sparse, and the focus ability of the exposure machine is not high. Even if there is a deviation in the exposure line, it is within the tolerance range. However, the lines of the new product are thin and dense, and a high-precision exposure machine is required. However, the depth of focus of the high-precision exposure machine is narrowed to only ±30 μm, so the requirements for the focusing abili...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F9/00G03F1/42
CPCG03F1/42G03F9/00G03F9/7076
Inventor 韩少华王健孙彬沈洪李晓华
Owner 江苏上达半导体有限公司
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