Test data optimization method and device for machine learning model and electronic device

A machine learning model and test data technology, applied in machine learning, computing models, instruments, etc., can solve the problems that the test data of the machine learning model is difficult to meet the requirements of the number of tests, and the test data is difficult to obtain, so as to achieve complete and accurate test data. , the effect of improving the accuracy

Pending Publication Date: 2020-02-14
北京淇瑀信息科技有限公司
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to obtain accurate results, a machine learning model requires a large amount of test data for performance evaluation. However, in general, it is difficult to obtain a large amount of test data, especially in the financial field. Machine learning models in the financial fie

Method used

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  • Test data optimization method and device for machine learning model and electronic device
  • Test data optimization method and device for machine learning model and electronic device
  • Test data optimization method and device for machine learning model and electronic device

Examples

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Example Embodiment

[0040] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar parts, and thus their repeated descriptions will be omitted.

[0041] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without on...

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Abstract

The invention relates to a test data optimization method and device for a machine learning model, an electronic device and a computer readable medium. The method comprises the steps of obtaining testdata, wherein the test data comprises a first score; determining a target score data set from a plurality of score data sets for the test data according to the first score, the score data set including at least one piece of score data, and the score data including a second score; and updating the first score in the test data by using the second score in the target score data in the target score data set, the updated test data being used for performing a model test of a machine learning model. According to the test data optimization method and device for the machine learning model and the electronic device, data optimization can be performed on the test data for the machine learning model, and the obtained test data is complete and accurate, so that the accuracy of the tested machine learning model is improved.

Description

technical field [0001] The present disclosure relates to the field of computer information processing, in particular, to a test data optimization method, device, electronic device, and computer-readable medium for a machine learning model. Background technique [0002] Machine learning has been greatly developed in various artificial intelligence research fields. Common machine learning models can be divided into three categories: supervised learning, unsupervised learning, and reinforcement learning. Each category can be divided into different types. algorithm. In most application scenarios today, people can easily find machine learning models suitable for their own problems. For the general application of machine learning models, the user first determines the machine learning model of a certain category or algorithm, and then according to the specific problem the user wants to solve, the user inputs specific data, the machine learning model establishes a specific task, an...

Claims

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Application Information

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IPC IPC(8): G06N20/00G06K9/62
CPCG06N20/00G06F18/214
Inventor 熊庄苏绥绥常富洋
Owner 北京淇瑀信息科技有限公司
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