A method for directional docking of cylindrical single crystals
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHINA INSTITUTE OF ATOMIC ENERGY
- Publication Date
- 2020-12-22
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Abstract
Description
technical field
[0001] The invention relates to single crystal orientation technology, in particular to a columnar single crystal orientation docking method. Background technique
[0002] There are currently two methods for determining the orientation of a single crystal by X-ray polycrystal diffractometer.
[0003] The first one is the X-ray θ scanning rotation method ([1] Guo Zhenqi, Li Fei, Zhu Shifu. Application of new device for XRD single crystal orientation[J]. Laboratory Science, 2011,14(6):92-96.[2 ] Liu Jingyan, Li Peng, Miao Zhuang. Comparison of two methods for measuring the off-angle of refractory single crystal planes[J]. The crystal system and lattice constant of the known material, such as figure 1 As shown, the diffraction angle θ of the target crystal plane (HKL) is calculated according to the Bragg diffraction law, and then the angle between the incident ray and the detector is fixed as (Π-2θ) and the incident ray, diffraction line and the normal of the ...