A method for directional docking of cylindrical single crystals

A cylindrical, single crystal technology, applied in chemical instruments and methods, crystal growth, after treatment, etc., can solve problems such as cumbersome process, unstable axial crystal orientation, azimuth angle, and damage to sample integrity, so as to improve work efficiency , the effect of shortening the time
CN110835782BActive Publication Date: 2020-12-22CHINA INSTITUTE OF ATOMIC ENERGY

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHINA INSTITUTE OF ATOMIC ENERGY
Publication Date
2020-12-22

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Abstract

The invention relates to a cylindrical single crystal directional docking method. The method includes acquiring Laue photos of single crystal A and single crystal B samples through a single crystal diffractometer, and calibrating the Laue photos to obtain a transformation matrix of the crystallographic coordinate system and the sample appearance coordinate system of the two single crystals respectively; through the transformation matrixes, calculating the angle of deviation alpha and the azimuth angle beta of the crystal orientation of two single crystals in the same non-axial crystal orientation respectively, so as to obtain crystal orientation projection positions of the two single crystals in the side surfaces of the samples so that the crystal orientation projection positions overlap to achieve docking of the single crystal A and the single crystal B. The method is intuitive and efficient, the orientation process will not cause damage to the samples, and misjudgment of single crystal or polycrystal is not liable to occur.
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Description

technical field

[0001] The invention relates to single crystal orientation technology, in particular to a columnar single crystal orientation docking method. Background technique

[0002] There are currently two methods for determining the orientation of a single crystal by X-ray polycrystal diffractometer.

[0003] The first one is the X-ray θ scanning rotation method ([1] Guo Zhenqi, Li Fei, Zhu Shifu. Application of new device for XRD single crystal orientation[J]. Laboratory Science, 2011,14(6):92-96.[2 ] Liu Jingyan, Li Peng, Miao Zhuang. Comparison of two methods for measuring the off-angle of refractory single crystal planes[J]. The crystal system and lattice constant of the known material, such as figure 1 As shown, the diffraction angle θ of the target crystal plane (HKL) is calculated according to the Bragg diffraction law, and then the angle between the incident ray and the detector is fixed as (Π-2θ) and the incident ray, diffraction line and the normal of the ...

Claims

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