A cloud-based integrated measurement and control platform for 5G and IoT devices

Abstract

The invention relates to a cloud-integrated measurement and control platform for 5G and IoT devices. The measurement and control platform includes a near-end analysis and test part, a cloud-based signal analysis and big data statistics part, and the near-end analysis and test part is used for near-end signal acquisition. , intelligent classification and test and measurement signal processing, the near-end analysis and test part includes at least one near-end sensor SU unit, and the cloud analysis and test part includes a cloud test service platform. After being divided into the near-end and the cloud, the part of the near-end sensor unit is greatly simplified compared with the original system, and it is easy to deploy and implement, while the cloud test and measurement tasks can meet the application test needs of more customers and improve the efficiency of the system.

Description

technical field [0001] The invention relates to the technical field of Internet of Things testing, in particular to a cloud-integrated measurement and control platform for 5G and Internet of Things devices. Background technique [0002] Cloud computing is a computing model developed on the basis of Distributed Computing, Parallel Computing and Grid Computing. sex, on-demand services, etc. Cloud computing can provide three levels of services: Infrastructure as a Service (Infra-structure as a Service), such as users can rent the hardware server of the platform, etc.; Platform as a Service (Platform as a Service), such as providing users with a test platform etc.; Software as a Service (Software as a Service), such as providing users with services for renting software applications, etc. There are three cloud models for cloud computing: public cloud, which is generally provided by third-party providers and available through the Internet, with low prices but cannot guarantee da...

AI Technical Summary

Problems solved by technology

Existing instrumentation tests all complete the process of signal acquisition and signal analysis at the same time, so the system structure is complex;

[0005] 2) The test and measurement of traditional instruments and meters is mainly completed by the instrument itself or the upper computer carried by the instrument itself, and can only support one test device, so the power consumption and volume are large, and at the same time, it causes a great waste of system and resources;

[0006] 3) When traditional instruments and meters complete the measurement task, the device under test needs to be in a specific working state, and this specific working state is determined by the device under test, and the instrument and meter always complete the measurement task passively;

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