Cloud integrated measurement and control platform for 5G and Internet of Things equipment

Abstract

The invention relates to a cloud integrated measurement and control platform for 5G and Internet of Things equipment. The measurement and control platform comprises a near-end analysis test part and acloud signal analysis and big data statistics part, wherein the near-end analysis and test part is used for near-end signal acquisition, intelligent classification and test measurement signal processing, the near-end analysis and test part comprises at least one near-end sensor SU unit, and the cloud analysis and test part comprises a cloud test service platform. After the near-end sensor unit isdivided into the near end and the cloud end, the near-end sensor unit is greatly simplified compared with an original system and is easy to deploy and implement, the cloud end test measurement task can meet the application test requirements of more customers, and the use efficiency of the system is improved.

Description

technical field [0001] The invention relates to the technical field of Internet of Things testing, in particular to a cloud integrated measurement and control platform for 5G and Internet of Things devices. Background technique [0002] Cloud computing is a computing model developed on the basis of distributed computing (Distributed Computing), parallel computing (Parallel Computing) and grid computing (Grid Computing), with ultra-large scale, virtualization, high reliability, and high scalability Features such as individuality and on-demand services. Cloud computing can provide three levels of services: Infrastructure as a Service (Infra-structure as a Service), such as users can rent platform hardware servers, etc.; Platform as a Service (Platform as a Service), such as providing users with a testing platform etc.; Software as a Service (Software as a Service), such as providing users with software application rental services, etc. There are three cloud models for cloud ...

AI Technical Summary

Problems solved by technology

Existing instrumentation tests all complete the process of signal acquisition and signal analysis at the same time, so the system structure is complex;

[0005] 2) The test and measurement of traditional instruments and meters is mainly completed by the instrument itself or the upper computer carried by the instrument itself, and can only support one test device, so the power consumption and volume are large, and at the same time, it causes a great waste of system and resources;

[0006] 3) When traditional instruments and meters complete the measurement task, the device under test needs to be in a specific working state, and this specific working state is determined by the device under test, and the instrument and meter always complete the measurement task passively;

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