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Near-field electromagnetic compatibility test equipment and test method for radio frequency integrated circuits

A technology for radio frequency integrated circuits and compatibility testing, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve problems such as testing methods for near-field emission electromagnetic interference testing equipment for radio frequency integrated circuits, and achieve good application prospects Effect

Active Publication Date: 2022-05-17
CIVIL AVIATION UNIV OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the near-field test only uses the near-field scanning method, and there is no test equipment and special test method capable of testing the near-field emission electromagnetic interference and near-field electromagnetic susceptibility of radio frequency integrated circuits.

Method used

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  • Near-field electromagnetic compatibility test equipment and test method for radio frequency integrated circuits
  • Near-field electromagnetic compatibility test equipment and test method for radio frequency integrated circuits
  • Near-field electromagnetic compatibility test equipment and test method for radio frequency integrated circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0053] The steps to test the near-field emission electromagnetic interference of radio frequency integrated circuits are as follows:

[0054] Step 1: Open the top cover 1-1 of the electromagnetic shielding case 1, place the test circuit installation platform 3 at the bottom position in the electromagnetic shielding case 1, and place the radio frequency integrated circuit board 4 to be tested on the circuit under test installation On stage 3, move the circuit under test installation stage 3 to ensure that the near-field probe 2 is facing the 74HC138 chip on the radio frequency integrated circuit board 4 under test;

[0055] Step 2: Pass the power cord and input cable of the radio frequency integrated circuit board 4 under test through the power cord hole 1-2, connect the power cord to the external power supply, and connect the input cable to the signal generator;

[0056] Step 3: Cover the top cover 1-1 of the electromagnetic shielding shell 1, and pass the connection cable of ...

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PUM

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Abstract

The invention relates to a radio frequency integrated circuit near-field electromagnetic compatibility testing device and a testing method thereof. The cover is opened and closed. On the side of the electromagnetic shielding shell, there are power line holes and signal line holes respectively. There is a probe cable hole in the center of the top cover of the electromagnetic shielding shell; the near-field probe is vertically fixed on the inner surface of the top cover. Below the cable hole, it is used to receive or transmit electromagnetic interference signals. Test the near-field emission electromagnetic interference of the integrated circuit to obtain the interference range and intensity of the externally radiated electromagnetic interference of the tested radio frequency integrated circuit; test the near-field electromagnetic susceptibility of the radio frequency integrated circuit to obtain the interference range and sensitivity threshold of the tested radio frequency integrated circuit. The invention can be used for near-field emission electromagnetic interference and near-field electromagnetic susceptibility testing of radio frequency integrated circuits.

Description

technical field [0001] The present invention relates to the field of electromagnetic compatibility testing equipment, in particular, to a radio frequency integrated circuit near-field electromagnetic compatibility testing equipment and a testing method thereof, which are used for near-field emission electromagnetic interference and near-field electromagnetic compatibility testing of radio frequency integrated circuits Near-field electromagnetic susceptibility testing. Background technique [0002] Due to the high operating frequency of radio frequency integrated circuits, electromagnetic interference will be generated externally during operation, and it will also be affected by other electromagnetic interference in the same environment. The electromagnetic compatibility of radio frequency integrated circuits is used to evaluate the ability of radio frequency integrated circuits to operate in compliance with the requirements in its electromagnetic environment, and the electro...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R31/28
CPCG01R31/002G01R31/2851
Inventor 史春蕾马振洋田毅董磊汪克念
Owner CIVIL AVIATION UNIV OF CHINA